Effects of heavy ion bombardment on TiO2 memristor operation

Radiation Effects and Defects in Solids

Volumn 166, Issue 1, 2011, Pages 1-7

  Marjanović, Nada ^a   Vujisić, Miloš ^a   Stanković, Koviljka ^a   Osmokrović, Predrag ^a  

^a School of Electrical Engineering   (Serbia)

Author keywords

heavy ions; memristor; Monte Carlo simulation; titanium dioxide

Indexed keywords

DOUBLE LAYERS; ELECTRONIC CONDUCTION; ION TRACK; MEMRISTOR; MONTE CARLO SIMULATION; NON-LINEAR; OXYGEN IONS; PARTICLE TRANSPORT; PLATINUM ELECTRODES; STATE-RETENTION; TIO; TITANIUM DIOXIDE THIN FILM;

COMPUTER SIMULATION; COSMIC RAY DETECTORS; ELECTRODES; HEAVY IONS; ION BOMBARDMENT; MONTE CARLO METHODS; OXIDES; OXYGEN; PASSIVE FILTERS; PLATINUM; RESISTORS; SPUTTERING; TITANIUM; TITANIUM DIOXIDE; VACANCIES;

OXYGEN VACANCIES;

EID: 78649726481     PISSN: 10420150     EISSN: 10294953     Source Type: Journal    
DOI: 10.1080/10420150.2010.533673     Document Type: Article

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