메뉴 건너뛰기




Volumn , Issue , 2010, Pages 177-180

Quasi-ballistic transport in nano-scale devices: Boundary layer, potential fluctuation, and Coulomb interaction

Author keywords

[No Author keywords available]

Indexed keywords

3D MONTE CARLO; BOLTZMANN TRANSPORT EQUATION; DEVICE PROPERTIES; DEVICE SIMULATORS; ELECTRON DISTRIBUTION FUNCTION; NANOSCALE DEVICE; PHYSICAL MECHANISM; POTENTIAL FLUCTUATIONS; QUASI-BALLISTIC TRANSPORT; TRANSPORT CHARACTERISTICS; VIRTUAL SOURCES;

EID: 78649568216     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SISPAD.2010.5604535     Document Type: Conference Paper
Times cited : (1)

References (6)
  • 1
    • 44949227132 scopus 로고    scopus 로고
    • MOSFET performance scaling - Part I: Historical trends
    • DOI 10.1109/TED.2008.921017
    • A. Khakifirooz and D. A. Antoniadis, "MOSFET Performance scaling - Part I: Historical trends," IEEE Trans. Electron Devices, ED-55, pp. 1391-1400, June 2008. (Pubitemid 351803240)
    • (2008) IEEE Transactions on Electron Devices , vol.55 , Issue.6 , pp. 1391-1400
    • Khakifirooz, A.1    Antoniadis, D.A.2
  • 2
    • 70350618608 scopus 로고    scopus 로고
    • Scaling MOSFETs to 10 nm: Coulomb effects, source starvation, and virtual source model
    • M. V. Fischetti et al., "Scaling MOSFETs to 10 nm: Coulomb effects, source starvation, and virtual source model," J. Comp. Electron., pp.60-77 (2009).
    • (2009) J. Comp. Electron. , pp. 60-77
    • Fischetti, M.V.1
  • 3
    • 37649030191 scopus 로고    scopus 로고
    • Kinetic of quasiballistic transport in nanoscale semiconductor structures: Is the ballistic limit attainable at room temperature?
    • N. Sano, "Kinetic of quasiballistic transport in nanoscale semiconductor structures: Is the ballistic limit attainable at room temperature?," Phys. Rev. Lett., 93, pp. 246803-1-4 (2004).
    • (2004) Phys. Rev. Lett. , vol.93 , pp. 2468031-2468034
    • Sano, N.1
  • 5
    • 0031191310 scopus 로고    scopus 로고
    • Elementary scattering theory of the SiMOSFET
    • M. Lundstrom, "Elementary Scattering Theory of the SiMOSFET," IEEE Electron. Devices Lett., 18, pp. 361-363 (1997).
    • (1997) IEEE Electron. Devices Lett. , vol.18 , pp. 361-363
    • Lundstrom, M.1
  • 6
    • 77952342287 scopus 로고    scopus 로고
    • Self-consistent Monte Carlo device simulations under nano-scale device structures: Role of Coulomb interaction, degeneracy, and boundary condition
    • K, Nakanishi, T. Uechi, N. Sano, "Self-consistent Monte Carlo device simulations under nano-scale device structures: Role of Coulomb interaction, degeneracy, and boundary condition," IEDM Tech. Dig., pp. 79-82 (2009).
    • (2009) IEDM Tech. Dig. , pp. 79-82
    • Nakanishi, K.1    Uechi, T.2    Sano, N.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.