-
1
-
-
0039527059
-
Structure and properties of ion-beam-modified (6H) silicon carbide
-
W.J. Weber, L.M. Wang, N. Yu, and N.J. Hess: Structure and properties of ion-beam-modified (6H) silicon carbide. Mater. Sci. Eng., A 253, 62 (1998).
-
(1998)
Mater. Sci. Eng., A
, vol.253
, pp. 62
-
-
Weber, W.J.1
Wang, L.M.2
Yu, N.3
Hess, N.J.4
-
2
-
-
11344261773
-
Temperature dependence of disorder accumulation and amorphization in Au-ion-irradiated 6H-SiC
-
W. Jiang, Y. Zhang, and W.J. Weber: Temperature dependence of disorder accumulation and amorphization in Au-ion-irradiated 6H-SiC Phys. Rev. B 70, 165208 (2004).
-
(2004)
Phys. Rev. B
, vol.70
, pp. 165208
-
-
Jiang, W.1
Zhang, Y.2
Weber, W.J.3
-
4
-
-
34447291122
-
Ion irradiation effects in nanocrystalline TiN coatings
-
H. Wang, R. Araujo, J.G. Swadener, Y.Q. Wang, X. Zhang, E.G. Fu, and T. Cagin: Ion irradiation effects in nanocrystalline TiN coatings. Nucl. Instrum. Methods Phys. Res., Sect. B 261, 1162(2007).
-
(2007)
Nucl. Instrum. Methods Phys. Res., Sect. B
, vol.261
, pp. 1162
-
-
Wang, H.1
Araujo, R.2
Swadener, J.G.3
Wang, Y.Q.4
Zhang, X.5
Fu, E.G.6
Cagin, T.7
-
5
-
-
72649091347
-
Response of nanocrystalline 3C silicon carbide to heavy-ion irradiation
-
W. Jiang, H. Wang, I. Kim, I-T. Bae, G. Li, P. Nachimuthu, Z. Zhu, Y. Zhang, and W.J. Weber: Response of nanocrystalline 3C silicon carbide to heavy-ion irradiation. Phys. Rev B 80, 161301(R) (2009).
-
(2009)
Phys. Rev B
, vol.80
-
-
Jiang, W.1
Wang, H.2
Kim, I.3
Bae, I.-T.4
Li, G.5
Nachimuthu, P.6
Zhu, Z.7
Zhang, Y.8
Weber, W.J.9
-
7
-
-
0039436823
-
Atomic scale simulation of defect production in irradiated 3C-SiC
-
R. Devanathan, W.J. Weber, and F. Gao: Atomic scale simulation of defect production in irradiated 3C-SiC J. Appl. Phys. 90, 2303 (2001).
-
(2001)
J. Appl. Phys.
, vol.90
, pp. 2303
-
-
Devanathan, R.1
Weber, W.J.2
Gao, F.3
-
8
-
-
66549120684
-
Damage profile and ion distribution of slow heavy ions in compounds
-
Y. Zhang, I-T. Bae, K. Sun, C.M. Wang, M. Ishimaru, Z. Zhu, W. Jiang, and W.J. Weber: Damage profile and ion distribution of slow heavy ions in compounds. J. Appl. Phys. 105, 104901 (2009).
-
(2009)
J. Appl. Phys.
, vol.105
, pp. 104901
-
-
Zhang, Y.1
Bae, I.-T.2
Sun, K.3
Wang, C.M.4
Ishimaru, M.5
Zhu, Z.6
Jiang, W.7
Weber, W.J.8
-
9
-
-
0032024367
-
Irradiation-induced amorphization in β-SiC
-
W.J. Weber, N. Yu, and L.M. Wang: Irradiation-induced amorphization in β-SiC. J. Nucl. Mater. 253, 53 (1998).
-
(1998)
J. Nucl. Mater.
, vol.253
, pp. 53
-
-
Weber, W.J.1
Yu, N.2
Wang, L.M.3
-
10
-
-
77955441908
-
Energy dissipation and defect generation in nanocrystalline silicon carbide
-
F. Gao, D. Chen, W. Hu, and W.J. Weber: Energy dissipation and defect generation in nanocrystalline silicon carbide. Phys. Rev. B 81, 184101 (2010).
-
(2010)
Phys. Rev. B
, vol.81
, pp. 184101
-
-
Gao, F.1
Chen, D.2
Hu, W.3
Weber, W.J.4
-
11
-
-
67649875686
-
Disorder accumulation and recovery in gold-ion irradiated 3C-SiC
-
W. Jiang, W.J. Weber, J. Lian, and N.M. Kalkhoran: Disorder accumulation and recovery in gold-ion irradiated 3C-SiC J. Appl. Phys. 105, 013529 (2009).
-
(2009)
J. Appl. Phys.
, vol.105
, pp. 013529
-
-
Jiang, W.1
Weber, W.J.2
Lian, J.3
Kalkhoran, N.M.4
-
12
-
-
42749105913
-
Atomistic study of intrinsic defect migration in 3C-SiC
-
F. Gao, W.J. Weber, M. Posselt, and V. Belko: Atomistic study of intrinsic defect migration in 3C-SiC Phys. Rev. B 69, 245205 (2004).
-
(2004)
Phys. Rev. B
, vol.69
, pp. 245205
-
-
Gao, F.1
Weber, W.J.2
Posselt, M.3
Belko, V.4
-
13
-
-
36749045237
-
Monte Carlo simulations of defect recovery within a 10 keV collision cascade in 3C-SiC
-
Z. Rong, F. Gao, W.J. Weber, and G. Hobler: Monte Carlo simulations of defect recovery within a 10 keV collision cascade in 3C-SiC J. Appl. Phys. 102, 103508 (2007).
-
(2007)
J. Appl. Phys.
, vol.102
, pp. 103508
-
-
Rong, Z.1
Gao, F.2
Weber, W.J.3
Hobler, G.4
-
14
-
-
2342457829
-
Effects of implantation temperature on damage accumulation in Al-implanted 4H-SiC
-
Y. Zhang, W.J. Weber, W. Jiang, C.M. Wang, V. Shutthanandan, and A. Hallen: Effects of implantation temperature on damage accumulation in Al-implanted 4H-SiC J. Appl. Phys. 95, 4012 (2004).
-
(2004)
J. Appl. Phys.
, vol.95
, pp. 4012
-
-
Zhang, Y.1
Weber, W.J.2
Jiang, W.3
Wang, C.M.4
Shutthanandan, V.5
Hallen, A.6
-
15
-
-
0001999389
-
Grain boundary mediated amorphization in silicon during ion irradiation
-
H.A. Atwater and W.L. Brown: Grain boundary mediated amorphization in silicon during ion irradiation. Appl. Phys. Lett. 56, 30 (1990).
-
(1990)
Appl. Phys. Lett.
, vol.56
, pp. 30
-
-
Atwater, H.A.1
Brown, W.L.2
-
16
-
-
0005603698
-
Heterogeneous amorphization of Si during ion irradiation: Dependence of amorphous Si nucleation kinetics on defect energy and structure
-
H.A. Atwater, J.S. Im, and W.L. Brown: Heterogeneous amorphization of Si during ion irradiation: Dependence of amorphous Si nucleation kinetics on defect energy and structure. Nucl. Instrum. Methods Phys. Res., Sect. B 59/60, 386 (1991).
-
(1991)
Nucl. Instrum. Methods Phys. Res., Sect. B
, vol.59-60
, pp. 386
-
-
Atwater, H.A.1
Im, J.S.2
Brown, W.L.3
-
17
-
-
0024104619
-
A defect model for ion-induced crystallization and amorphization
-
K.A. Jackson: A defect model for ion-induced crystallization and amorphization. J. Mater. Res. 3, 1218 (1988).
-
(1988)
J. Mater. Res.
, vol.3
, pp. 1218
-
-
Jackson, K.A.1
-
18
-
-
0032738919
-
Light particle irradiation effects in Si nanocrystals
-
G.A. Kachurin, M-O. Ruault, A.K. Gutakovsky, O. Kaïtasov, S.G. Yanovskaya, K.S. Zhuravlev, and H. Bernas: Light particle irradiation effects in Si nanocrystals. Nucl. Instrum. Methods Phys. Res., Sect. B 147, 356 (1999).
-
(1999)
Nucl. Instrum. Methods Phys. Res., Sect. B
, vol.147
, pp. 356
-
-
Kachurin, G.A.1
Ruault, M.-O.2
Gutakovsky, A.K.3
Kaïtasov, O.4
Yanovskaya, S.G.5
Zhuravlev, K.S.6
Bernas, H.7
-
19
-
-
41549113822
-
Radiation tolerance in a nanostructure: Is smaller better?
-
T.D. Shen: Radiation tolerance in a nanostructure: Is smaller better? Nucl. Instrum. Methods Phys. Res., Sect. B 266, 921 (2008).
-
(2008)
Nucl. Instrum. Methods Phys. Res., Sect. B
, vol.266
, pp. 921
-
-
Shen, T.D.1
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