Instrumental developments for anomalous small-angle X-ray scattering from soft matter systems

Journal of Applied Crystallography

Volumn 43, Issue 6, 2010, Pages 1479-1487

  Sztucki, Michael ^a   Di Cola, Emanuela ^a   Narayanan, Theyencheri ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

anomalous small angle X ray scattering; charged soft matter; small angle X ray scattering

Indexed keywords

ABSORPTION EDGES; ANOMALOUS SCATTERING; ANOMALOUS SMALL-ANGLE X-RAY SCATTERINGS; CATIONIC SURFACTANT MICELLES; COUNTERIONS; ELECTROCHEMICAL METHODS; EXPERIMENTAL SETUP; HIGH-ENERGY RESOLUTION; IN-SITU CALIBRATION; MICELLAR SURFACES; NONRESONANT; RADIAL PROFILES; SINGLE PHOTON DETECTION; SMALL-ANGLE X-RAY SCATTERING; SOFT MATTER;

BROMINE; BROMINE COMPOUNDS; CATIONIC SURFACTANTS; DAMAGE DETECTION; DYES; IONS; MICELLES; MULTIPHOTON PROCESSES; RADIATION DAMAGE; X RAY SCATTERING; X RAYS;

SCATTERING;

EID: 78649498418     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S002188981003298X     Document Type: Article

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