Impedance analysis and local conductivity measurements of SrBi 2Nb2O9 ceramics

Phase Transitions

Volumn 83, Issue 10-11, 2010, Pages 897-908

  Kajewski, D ^a   Ujma, Z ^a  

^a UNIVERSITY OF SILESIA   (Poland)

Author keywords

ceramics; dielectric properties; electrical properties; electron microscopy; X ray diffraction

Indexed keywords

AURIVILLIUS; CERAMICS; CONDUCTIVE ATOMIC FORCE MICROSCOPES; CONDUCTIVITY MEASUREMENTS; DIELECTRIC DISPERSION; ELECTRICAL PROPERTIES; ELECTRICAL PROPERTY; GRAIN STRUCTURES; HIGH TEMPERATURE; IMPEDANCE ANALYSIS; IMPEDANCE SPECTROSCOPY MEASUREMENTS; LATTICE PARAMETERS; LOW FREQUENCY; LOW TEMPERATURES; ORTHORHOMBIC STRUCTURES; SOLID STATE REACTION METHOD; SPACE-CHARGE CARRIERS; TEMPERATURE DEPENDENCE; THERMAL ACTIVATION ENERGIES; X-RAY DIFFRACTION STUDIES;

ACTIVATION ENERGY; CERAMIC MATERIALS; DIFFRACTION; ELECTRIC CONDUCTIVITY; ELECTRIC CONDUCTIVITY MEASUREMENT; OXYGEN; OXYGEN VACANCIES; SCANNING ELECTRON MICROSCOPY; SOLID STATE REACTIONS; X RAY DIFFRACTION; X RAYS;

DIELECTRIC PROPERTIES;

EID: 78649371423     PISSN: 01411594     EISSN: 10290338     Source Type: Journal    
DOI: 10.1080/01411594.2010.509590     Document Type: Conference Paper

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