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Volumn 71, Issue 1, 2010, Pages 24-29
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Electrical properties of SrBi2(Nb0.5Ta0.5)2O9 ceramics
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Author keywords
A. Ceramics; C. Electron microscopy; C. X ray diffraction; D. Dielectric properties; D. Electrical properties
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Indexed keywords
AURIVILLIUS;
C. ELECTRON MICROSCOPY;
D. DIELECTRIC PROPERTIES;
DIELECTRIC DISPERSION;
ELECTRICAL PROPERTY;
GRAIN STRUCTURES;
HIGH TEMPERATURE;
IMPEDANCE SPECTROSCOPY MEASUREMENTS;
LATTICE PARAMETERS;
LOW FREQUENCY;
LOW TEMPERATURE REGIONS;
ORTHORHOMBIC STRUCTURES;
SOLID STATE REACTION METHOD;
SPACE-CHARGE CARRIERS;
TEMPERATURE DEPENDENCE;
THERMAL ACTIVATION ENERGIES;
XRD STUDIES;
ACTIVATION ENERGY;
CERAMIC MATERIALS;
DIFFRACTION;
ELECTRIC CONDUCTIVITY;
NIOBIUM;
OXYGEN;
OXYGEN VACANCIES;
SCANNING ELECTRON MICROSCOPY;
TANTALUM;
X RAY DIFFRACTION;
DIELECTRIC PROPERTIES;
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EID: 70449670297
PISSN: 00223697
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jpcs.2009.10.001 Document Type: Article |
Times cited : (22)
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References (16)
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