Dielectric properties and phase transition in SrBi2Nb2O9-SrBi2Ta2O9 solid solution

Ceramics International

Volumn 35, Issue 6, 2009, Pages 2351-2355

  Kajewski, D ^a   Ujma, Z ^a   Szot, K ^a,b   Pawelczyk M ^a  

^a UNIVERSITY OF SILESIA   (Poland)

^b FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

B. Electron microscopy; B. X ray methods; C. Dielectric properties; D. Perovskites

Indexed keywords

AURIVILLIUS STRUCTURE; B. ELECTRON MICROSCOPY; B. X-RAY METHODS; C. DIELECTRIC PROPERTIES; CHEMICAL COMPOSITIONS; CONCENTRATION OF; D. PEROVSKITES; EDS ANALYSIS; ENERGY DISPERSION SPECTROMETERS; GRAIN STRUCTURES; HOMOGENEOUS DISTRIBUTION; ORTHORHOMBIC FERROELECTRIC PHASE; PARAELECTRIC PHASE; ROOM TEMPERATURE; SCANNING ELECTRON MICROSCOPES; TA CONTENT; X-RAY DIFFRACTION STUDIES;

CERAMIC CAPACITORS; CRYSTALLIZATION; ELECTRON MICROSCOPES; NIOBIUM; PERMITTIVITY; PEROVSKITE; SCANNING ELECTRON MICROSCOPY; SOLID SOLUTIONS; SOLIDIFICATION; SPECTROMETERS; STRUCTURAL PROPERTIES; TANTALUM; X RAY ANALYSIS;

CRYSTAL STRUCTURE;

EID: 67349195979     PISSN: 02728842     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ceramint.2009.01.013     Document Type: Article

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