Development of a point-of-care testing platform with a nanogap-embedded separated double-gate field effect transistor array and its readout system for detection of avian influenza

IEEE Sensors Journal

Volumn 11, Issue 2, 2011, Pages 351-360

  Im, Maesoon ^a,b   Ahn, Jae Hyuk ^b   Han, Jin Woo ^b   Park, Tae Jung ^b   Lee, Sang Yup ^b   Choi, Yang Kyu ^b  

^a UNIVERSITY OF MICHIGAN   (United States)

^b Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

Avian influenza (AI); biosensor; field effect transistor (FET); nanogap; point of care testing (POCT); silica binding proteins (SBP)

Indexed keywords

AVIAN INFLUENZA; BINDING PROTEINS; BIOSENSOR ARRAYS; COMPLEMENTARY METAL-OXIDE-SEMICONDUCTOR TECHNOLOGIES; DIELECTRIC CONSTANTS; DOUBLE-GATE; DOUBLE-GATE FETS; ELECTRICAL DETECTION; LABEL FREE; LABEL-FREE DETECTION; LOW NOISE; MEASUREMENT SETUP; NANO-GAP; POINT-OF-CARE TESTING; READ-OUT CIRCUIT; READOUT CIRCUITRY; SOURCE CURRENTS; STANDARD CMOS PROCESS; TRANSISTOR ARRAYS;

CMOS INTEGRATED CIRCUITS; DRAIN CURRENT; FABRICATION; FIELD EFFECT TRANSISTORS; GATE DIELECTRICS; GATES (TRANSISTOR); MESFET DEVICES; PROTEINS; READOUT SYSTEMS; SILICA;

BIOSENSORS;

EID: 78649264150     PISSN: 1530437X     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSEN.2010.2062502     Document Type: Article

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