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Volumn 68, Issue 1, 2000, Pages 134-139

Low frequency noise and drift in Ion Sensitive Field Effect Transistors

Author keywords

[No Author keywords available]

Indexed keywords

BIOSENSORS; CURRENT DENSITY; FREQUENCIES; LEAKAGE CURRENTS; PH; SPECTRUM ANALYSIS; SPURIOUS SIGNAL NOISE; THERMAL EFFECTS;

DRIFT; LOW FREQUENCY NOISE; POWER SPECTRAL DENSITY;

ION SENSITIVE FIELD EFFECT TRANSISTORS;

EID: 0034250133 PISSN: 09254005 EISSN: None Source Type: Journal
DOI: 10.1016/S0925-4005(00)00473-1 Document Type: Article

Times cited : (48)

References (12)

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