Monitoring the key technology trends by combining chance discovery and survival analysis: Study on solar cell patent documents

PICMET '10 - Portland International Center for Management of Engineering and Technology, Proceedings - Technology Management for Global Economic Growth

Volumn , Issue , 2010, Pages 2185-2191

  Wang, Ming Yeu ^a   Chiu, Tzu Fu ^b  

^a NATIONAL CHIAYI UNIVERSITY   (Taiwan)

^b ALETHEIA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

CHANCE DISCOVERY; HARD WORK; HAZARD RATES; KEY TECHNOLOGIES; LONGITUDINAL ANALYSIS; NEW APPROACHES; PATENT DOCUMENTS; PATENT NUMBER; SURVIVAL ANALYSIS; TEXT FORMAT; TEXT MINING TECHNIQUES;

BIOINFORMATICS; ECONOMICS; INDUSTRIAL MANAGEMENT; PATENTS AND INVENTIONS; SAFETY ENGINEERING; SOLAR CELLS;

TECHNOLOGY;

EID: 78549234081     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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