X-ray laser spectroscopy of highly charged ions at FLASH

Journal of Physics B: Atomic, Molecular and Optical Physics

Volumn 43, Issue 19, 2010, Pages

  Epp, S W ^a,b   López Urrutia, J R Crespo ^b   Simon, M C ^b   Baumann, T ^b   Brenner, G ^c   Ginzel, R ^b   Guerassimova, N ^c   Mackel V ^b   Mokler, P H ^b   Schmitt, B L ^b   Tawara, H ^b   Ullrich, J ^a,b  

^a CFEL   (Germany)

^b MAX PLANCK INSTITUT FÜR KERNPHYSIK   (Germany)

^c DESY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAM ION TRAPS; FLUORESCENCE EXCITATION; HARD X-RAY SPECTROSCOPY; HIGHLY CHARGED IONS; LI-LIKE IONS; ORDER OF MAGNITUDE; PARTS-PER-MILLION; RESOLVING POWER; SOFT X-RAY; SOFT X-RAY REGIONS; SPECTRAL REGION; WAVE-LENGTH STANDARD;

ELECTRON BEAMS; FLUORESCENCE; FREE ELECTRON LASERS; IONS; LASER SPECTROSCOPY; LITHIUM; PARTICLE BEAM INJECTION; X RAY LASERS; X RAY SPECTROSCOPY;

X RAYS;

EID: 78249237861     PISSN: 09534075     EISSN: 13616455     Source Type: Journal    
DOI: 10.1088/0953-4075/43/19/194008     Document Type: Article

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