Photoionization of N3+ and Ar8+ in an electron beam ion trap by synchrotron radiation

Journal of Physics B: Atomic, Molecular and Optical Physics

Volumn 43, Issue 6, 2010, Pages

  Simon, M C ^a   Schwarz, M ^a   Epp, S W ^a,b   Beilmann, C ^a   Schmitt, B L ^a   Harman, Z ^a,c   Baumann, T M ^a   Mokler, P H ^a   Bernitt, S ^a   Ginzel, R ^a   Higgins, S G ^a   Keitel, C H ^a   Klawitter, R ^a   Kubicek K ^a   MacKel V ^a   Ullrich, J ^a   López Urrutia, J R Crespo ^a  

^a MAX PLANCK INSTITUT FÜR KERNPHYSIK   (Germany)

^b Max Planck Advanced Study Group   (Germany)

^c GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE STATE; CURRENT LIMITATION; ELECTRON BEAM ION TRAPS; ELECTRON STORAGE RING; EXPERIMENTAL DATA; HIGH RESOLUTION; HIGHLY CHARGED IONS; MULTICONFIGURATION DIRAC-FOCK; THEORETICAL MODELS; THRESHOLD REGIONS;

ELECTRON BEAMS; PARTICLE BEAM INJECTION; PHOTOIONIZATION; STORAGE RINGS; SYNCHROTRON RADIATION; SYNCHROTRONS;

IONS;

EID: 77949908504     PISSN: 09534075     EISSN: 13616455     Source Type: Journal    
DOI: 10.1088/0953-4075/43/6/065003     Document Type: Article

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