Grazing incidence wide angle x-ray scattering at the wiggler beamline BW4 of HASYLAB

Review of Scientific Instruments

Volumn 81, Issue 10, 2010, Pages

  Perlich, J ^a   Rubeck, J ^a   Botta, S ^a   Gehrke, R ^a   Roth, S V ^a   Ruderer, M A ^b   Prams, S M ^b   Rawolle, M ^b   Zhong, Q ^b   Korstgens V ^b   Muller Buschbaum P ^b  

^a DESY   (Germany)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINITIES; DIFFRACTION MEASUREMENTS; FIRST ORDER; GI-SAXS; GRAZING INCIDENCE; GRAZING INCIDENCE SMALL-ANGLE X-RAY SCATTERING; MEASUREMENT GEOMETRY; MEASUREMENT TECHNIQUES; MICRO BEAMS; MICROMETER LENGTHS; POLY(3-OCTYLTHIOPHENE)-(P3OT); SEMICRYSTALLINES; SUBNANOMETERS; THIRD ORDER; WIDE ANGLE X-RAY SCATTERING; WIDE-ANGLE SCATTERING; WIGGLER BEAMLINE; X-RAY DIFFRACTION METHOD;

DIFFRACTION; SCATTERING; THIN FILMS; WIGGLERS; X RAY DIFFRACTION; X RAY SCATTERING; X RAYS;

X RAY DIFFRACTION ANALYSIS;

EID: 78149463542     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3488459     Document Type: Conference Paper

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