Method of non-destructive measurement for plant leaf area and its instrument development

Nongye Gongcheng Xuebao/Transactions of the Chinese Society of Agricultural Engineering

Volumn 26, Issue 9, 2010, Pages 198-202

  Nie, Pengcheng ^a,b   Yang, Yan ^a,c   Liu, Fei ^a   Zheng, Jintu ^d   He, Yong ^a  

^a ZHEJIANG UNIVERSITY   (China)

^b NANCHANG HANGKONG UNIVERSITY   (China)

^c GUANGXI TEACHERS EDUCATION UNIVERSITY   (China)

^d Ningbo Extension Center for Forestry Sciences   (China)

Author keywords

Instruments; Neural network; Non destructive measurement; Plant leaf area; Wireless networks

Indexed keywords

ACCURATE MEASUREMENT; BACK PROPAGATION NEURAL NETWORKS; DETERMINATION COEFFICIENTS; ENVIRONMENTAL TEMPERATURE; INSTRUMENT DEVELOPMENT; LEAF AREA; LEAF AREA INDEX; LIGHT INTENSITY; MEASURING ACCURACY; MEASURING INSTRUMENTS; MEASURING METHOD; NON DESTRUCTIVE; NON-DESTRUCTIVE MEASUREMENT; PHOTOELECTRIC SENSORS; PLANT LEAF; POLY-SI; SOURCE SYSTEMS;

INSTRUMENTS; LIGHT SOURCES; PHOTOELECTRICITY; POLYSILICON; SENSORS; WIRELESS NETWORKS;

NEURAL NETWORKS;

EID: 78149405228     PISSN: 10026819     EISSN: None     Source Type: Journal    
DOI: 10.3969/j.issn.1002-6819.2010.09.034     Document Type: Article

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