Detailed X-ray diffraction analyses and correlation of microstructural and electromechanical properties of La-doped PZT ceramics

Journal of Electroceramics

Volumn 2, Issue 2, 1998, Pages 75-84

  Hammer, Marianne ^a   Hoffmann, Michael J ^a  

^a UNIVERSITY OF KARLSRUHE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION EFFECTS; CRYSTAL MICROSTRUCTURE; DENSIFICATION; DOPING (ADDITIVES); GRAIN SIZE AND SHAPE; LANTHANUM; LEAD COMPOUNDS; MECHANICAL PROPERTIES; PERMITTIVITY MEASUREMENT; POROSITY; X RAY DIFFRACTION ANALYSIS;

CURIE TEMPERATURE; LEAD ZIRCONATE TITANATE;

CERAMIC MATERIALS;

EID: 0032256740     PISSN: 13853449     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1009954822076     Document Type: Article

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