An outlier correction procedure and its application to areal surface data measured by optical instruments

Measurement Science and Technology

Volumn 21, Issue 10, 2010, Pages

  Fauzi Ismail, Mohd ^a,b   Yanagi, Kazuhisa ^a   Fujii, Akihiro ^c  

^a NAGAOKA UNIVERSITY OF TECHNOLOGY   (Japan)

^b UNIVERSITI TEKNOLOGI MARA   (Malaysia)

^c OLYMPUS CORPORATION   (Japan)

Author keywords

Cumulative probability curve; Median of relative height; Outlier detection; Surface topography

Indexed keywords

DATA HANDLING; DENTAL PROSTHESES; STATISTICS; SURFACE MEASUREMENT; SURFACE ROUGHNESS; TOPOGRAPHY;

ACCURACY AND REPEATABILITIES; AREAL SURFACE TOPOGRAPHIES; CONFOCAL LASER SCANNING MICROSCOPE; CUMULATIVE PROBABILITIES; OUTLIER DETECTION; RELATIVE HEIGHTS; REPEATED MEASUREMENTS; SURFACE ROUGHNESS PARAMETERS;

SURFACE TOPOGRAPHY;

EID: 78149330643     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/21/10/105105     Document Type: Article

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