Ion beam induced interface mixing of Ni on PTFE bilayer system studied by quadrupole mass analysis and electron spectroscopy for chemical analysis

Vacuum

Volumn 84, Issue 11, 2010, Pages 1275-1279

  Prakash, Jai ^a   Tripathi, A ^b   Khan, S A ^b   Pivin, J C ^c   Singh, F ^b   Tripathi, Jalaj ^a   Kumar, Sarvesh ^d   Avasthi, D K ^b  

^a MMH PG College   (India)

^b INTER UNIVERSITY ACCELERATOR CENTRE   (India)

^c CENTRE DE CALCUL DE L INSTITUT NATIONAL DE PHYSIQUE NUCLEAIRE ET DE PHYSIQUE DES PARTICULES   (France)

^d MANAV RACHNA INTERNATIONAL INSTITUTE OF RESEARCH AND STUDIES   (India)

Author keywords

Ion beam mixing (IBM); Ion track chemistry; Polytetrafluoroethylene (PTFE); Swift heavy ions (SHI)

Indexed keywords

ATOMIC TRANSPORT; BEFORE AND AFTER; BILAYER SYSTEMS; CHEMICAL ALTERATION; ELECTRON SPECTROSCOPY FOR CHEMICAL ANALYSIS; FLUENCES; HOT ZONE; IN-SITU; INTERFACE MIXING; INTERFACIAL CHEMISTRY; ION BEAM MIXING; ION FLUENCES; ION PATHS; ION TRACK; ION TRACK CHEMISTRY; METAL-POLYMER COMPLEXES; NI FILMS; QUADRUPOLE MASS ANALYSIS; REACTIVE SPECIES; RUTHERFORD BACKSCATTERING SPECTROMETRY; SWIFT HEAVY ION IRRADIATION; SWIFT HEAVY IONS;

ATOMIC FORCE MICROSCOPY; BEAM PLASMA INTERACTIONS; CHEMICAL ANALYSIS; CHEMICAL REACTIONS; CHEMICALS; ELECTRON SPECTROSCOPY; FLUORINE; HEAVY IONS; ION BEAMS; ION BOMBARDMENT; MIXING; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SURFACE ROUGHNESS;

POLYTETRAFLUOROETHYLENES;

EID: 78049415225     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2010.02.003     Document Type: Article

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