Superresolution imaging-revisited

Advances in Imaging and Electron Physics

Volumn 163, Issue C, 2010, Pages 165-218

  Testorf, Markus E ^a   Fiddy, Michael A ^b  

^a DARTMOUTH COLLEGE   (United States)

^b UNIVERSITY OF NORTH CAROLINA AT CHARLOTTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEGREES OF FREEDOM (MECHANICS); ECONOMIC AND SOCIAL EFFECTS; IMAGE RECONSTRUCTION; IMAGING TECHNIQUES; OPTICAL RESOLVING POWER;

DEGREE OF FREEDOM; DIFFRACTION-LIMITED SYSTEMS; RAYLEIGH CRITERION; RAYLEIGH LIMIT; SPATIAL INFORMATIONS; SPATIAL RESOLUTION; SUPER RESOLUTION; SUPER RESOLUTION IMAGING;

IMAGE RESOLUTION;

EID: 78049355622     PISSN: 10765670     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S1076-5670(10)63005-4     Document Type: Article

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