Pseudorandom phase masks for superresolution imaging from subpixel shifting

Applied Optics

Volumn 46, Issue 12, 2007, Pages 2256-2268

  Ashok, Amit ^a   Neifeld, Mark A ^a,b  

^a University of Arizona   (United States)

^b College of Optical Sciences   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; LENSES; MASKS; OPTICAL RESOLVING POWER; PIXELS;

DIGITAL IMAGERS; OPTICAL POINT-SPREAD FUNCTION; PHASE MASKS; PSEUDORANDOM PHASE-ENHANCED LENS (PRFEL); SUPERRESOLUTION IMAGING;

IMAGING SYSTEMS;

ALGORITHM; ARTICLE; COMPUTER ASSISTED DIAGNOSIS; COMPUTER SIMULATION; EVALUATION; IMAGE ENHANCEMENT; INFORMATION RETRIEVAL; METHODOLOGY; REPRODUCIBILITY; SAMPLE SIZE; SENSITIVITY AND SPECIFICITY; SIGNAL PROCESSING; THEORETICAL MODEL;

ALGORITHMS; COMPUTER SIMULATION; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; INFORMATION STORAGE AND RETRIEVAL; MODELS, THEORETICAL; REPRODUCIBILITY OF RESULTS; SAMPLE SIZE; SENSITIVITY AND SPECIFICITY; SIGNAL PROCESSING, COMPUTER-ASSISTED;

EID: 34250706845     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.46.002256     Document Type: Article

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