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Volumn 49, Issue 8 PART 4, 2010, Pages
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Development of high-resolution imaging of solid-liquid interface by frequency modulation atomic force microscopy
a
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Author keywords
[No Author keywords available]
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Indexed keywords
AFM;
AU THIN FILMS;
BUFFER SOLUTIONS;
CONDITIONING TREATMENT;
DEFLECTION SENSORS;
DETECTION TECHNIQUE;
DNA STRUCTURE;
DYNAMIC MODES;
FREQUENCY MODULATION ATOMIC FORCE MICROSCOPY;
HIGH RESOLUTION IMAGE;
HIGH-RESOLUTION IMAGING;
HYDRODYNAMIC DAMPING;
LIQUID ENVIRONMENT;
NOISE DENSITY;
NOISE LEVELS;
POLYPROPYLENE SHEETS;
Q-FACTORS;
SOLID-LIQUID INTERFACES;
THERMAL DRIFTS;
ATOMIC FORCE MICROSCOPY;
ATOMS;
FREQUENCY MODULATION;
GOLD;
IMAGING TECHNIQUES;
LIQUIDS;
SENSORS;
PHASE INTERFACES;
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EID: 78049352615
PISSN: 00214922
EISSN: 13474065
Source Type: Journal
DOI: 10.1143/JJAP.49.08LB12 Document Type: Conference Paper |
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Times cited : (13)
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References (8)
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