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Volumn 49, Issue 9 PART 2, 2010, Pages
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Annealing effects on sensitivity of atomic-layer-deposited SrTiO 3-based oxygen sensors
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING EFFECTS;
ANNEALING TEMPERATURES;
ATOMIC LAYER DEPOSITED;
HIGH SENSITIVITY;
IN-SITU MONITORING;
KEY PARAMETERS;
MANUFACTURING PROCESS;
ROOM TEMPERATURE;
SEMICONDUCTIVE;
SRTIO;
TRACE LEVEL;
DEPOSITION;
LIGHT EMITTING DIODES;
ORGANIC LIGHT EMITTING DIODES (OLED);
OXYGEN;
SEGREGATION (METALLOGRAPHY);
STRONTIUM ALLOYS;
THIN FILMS;
SURFACE SEGREGATION;
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EID: 78049326599
PISSN: 00214922
EISSN: 13474065
Source Type: Journal
DOI: 10.1143/JJAP.49.09MA15 Document Type: Conference Paper |
Times cited : (10)
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References (24)
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