Characterization of chemical composition and electronic structure of Pt/YSZ interfaces by analytical transmission electron microscopy

Solid State Ionics

Volumn 181, Issue 35-36, 2010, Pages 1616-1622

  Srot, V ^a   Watanabe, M ^b   Scheu, C ^c   Van Aken, P A ^a   Salzberger, U ^a   Luerssen B ^d   Janek, J ^d   Ruhle M ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b Lehigh University   (United States)

^c UNIVERSITY OF MUNICH   (Germany)

^d JUSTUS LIEBIG UNIVERSITY   (Germany)

Author keywords

factor method; Ab initio multiple scattering calculations; Electron energy loss near edge structure; Electron energy loss spectroscopy; Spatial difference technique; X ray energy dispersive spectroscopy

Indexed keywords

AB INITIO; ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY; CHEMICAL COMPOSITIONS; ELECTRON ENERGIES; ELECTRON ENERGY LOSS NEAR EDGE STRUCTURE; FULL MULTIPLE SCATTERING; INTER-DIFFUSION; ORIENTATION RELATIONSHIP; RESOLUTION LIMITS; SPATIAL DIFFERENCES; SPECIFIC COMPONENT; STABILIZED ZIRCONIA; STRUCTURE MODELING; X-RAY ENERGY DISPERSIVE SPECTROSCOPY;

DISSOCIATION; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; ELECTRONIC STRUCTURE; ELECTRONS; ENERGY DISPERSIVE SPECTROSCOPY; MULTIPLE SCATTERING; PLATINUM; TRANSMISSION ELECTRON MICROSCOPY; X RAYS; ZIRCONIA;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 78049260073     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssi.2010.08.026     Document Type: Article

References (55)

1. Z.L. Wang, and Z.C. Kang Functional and Smart Materials 1998 Plenum Press New York and London 514 pp
2. F. Ernst Materials Science and Engineering R14 1995 97
3. A.P. Sutton, and R.W. Balluffi Interfaces in Crystalline Materials 1995 Oxford University Press 819 pp
4. M. Rühle J. of the European Ceramic Society 16 1996 353
5. R. Brydson J. of Microscopy 180 1995 238
6. N.D. Browning, M.F. Chisholm, and S.J. Pennycook Nature 366 1993 143
7. P.E. Batson Nature 366 1993 727
8. N.D. Browning, E.M. James, K. Kishida, I. Arslan, J.P. Buban, J.A. Zaborac, S.J. Pennycook, Y. Xin, and G. Duscher Rev. Adv. Mat. Sci. 1 2000 1
9. R. Brydson, H. Müllejans, J. Bruley, P.A. Trusty, X. Sun, J.A. Yeomans, and M. Rühle J. of Microscopy 177 1995 369
10. R. Brydson, J. Bruley, H. Müllejans, C. Scheu, and M. Rühle Ultramicroscopy 59 1995 81
11. R. Brydson J. Phys. D: Appl. Phys. 29 1996 1699
12. C. Scheu, G. Dehm, M. Rühle, and R. Brydson Philosophical Magazine A 78 1998 439
13. K. van Benthem, C. Elsässer, and M. Rühle Physical Review B 72 2005 125435
14. P. Rez, and D.A. Muller The Annual Review of Materials Research 2008 18.1
15. S.B. Sinnot, and E.C. Dickey Mat. Sci. And Eng. R 43 2003 1
16. G. Beck, H. Fischer, E. Mutoro, V. Srot, K. Petrikowski, E. Tchernychova, M. Wuttig, M. Rühle, B. Luerßen, and J. Janek Solid State Ionics 178 2007 327
17. E. Mutoro, S. Günther, B. Luerßen, I. Valov, and J. Janek Solid State Ionics 179 2008 1835
18. E.J.L. Schouler, and M. Kleitz J. Electrochem. Soc. 134 1987 1045
19. A. Mitterdorfer, and L.J. Gauckler Solid State Ionics 117 1999 187
20. D.W. McComb Physical Review 54 1996 7094
21. S. Ostanin, A.J. Craven, D.W. McComb, D. Vlachos, A. Alavi, M.W. Finnis, and A.T. Paxton Physical Review B 62 2000 14728
22. D. Vlachos, A.J. Craven, and D.W. McComb J. Phys.: Condens. Matter 13 2001 10799
23. S. Ostanin, A.J. Craven, D.W. McComb, D. Vlachos, A. Alavi, A.T. Paxton, and M.W. Finnis Physical Review B 65 2002 224109
24. D.W. McComb, S. Ostanin, D. Vlachos, A.J. Craven, M.W. Finnis, A.T. Paxton, and A. Alavi Mat. Res. Soc. Symp. Proc. 2002 699
25. M. Alfredsson, S.T. Bromley, and C.R.A. Catlow M.A.C. Nascimento, Theoretical Aspects of Heterogeneous Catalysis 2001 109
26. M. Alfredsson, and C.R.A. Catlow Phys. Chem. Chem. Phys. 3 2001 4129
27. M. Alfredsson, and C.R.A. Catlow Phys. Chem. Chem. Phys. 4 2002 6100
28. C.R.A. Catlow, S.A. French, A.A. Sokol, M. Alfredsson, and S.T. Bromley Faraday Discuss. 124 2003 185
29. M. Alfredsson, and C.R.A. Catlow Surface Science 561 2004 43
30. E. Mutoro, B. Luerßen, S. Günther, and J. Janek Solid State Ionics 180 2009 1019
31. J. Janek, B. Luerssen, E. Mutoro, H. Fischer, and S. Günther Topics in Catalysis 44 2007 399
32. J.J. Rehr, and R.C. Albers Rev. Mod. Phys. 72 2000 621
33. J.J. Rehr, and A.L. Ankudinov Int. Journal of Quantum Chemistry 95 2003 487
34. J.J. Rehr, and A.L. Ankudinov Coordination Chemistry Reviews 249 2005 131
35. E.C. Subbarao Science and Technology of Zirconia A.H. Heuer, L.W. Hobbs, Advances in Ceramics vol. 3 1981 The American Ceramic Society 1
36. A. Navrotsky J. of Materials Chemistry 15 2005 1883
37. A. Strecker, U. Salzberger, and J. Mayer Prakt. Metallogr. 30 1993 482
38. F. Phillipp, R. Höschen, M. Osaki, G. Möbus, and M. Rühle Ultramicroscopy 56 1994 1
39. M. Watanabe, and D.B. Williams J. of Microscopy 221 2006 89
40. R.F. Egerton Electron Energy-Loss Spectroscopy in the Electron Microscope 1996 Plenum Press 485 pp
41. K. Kimoto, T. Sekiguchi, and T. Aoyama Japanese Society of Electron Microscopy 46 1997 369
42. T. Walther Ultramicroscopy 96 2003 401
43. H. Müllejans, and J. Bruley Ultramicroscopy 53 1994 351
44. H. Müllejans, and J. Bruley J. of Microscopy 180 1995 12
45. E.C. Dickey, V.P. Dravid, P.D. Nellist, D.J. Wallis, S.J. Pennycook, and A. Revcolevschi Microscopy and Microanalysis 3 1997 443
46. C. Scheu Journal of Microscopy 207 2002 52
47. M. Gao, C. Scheu, E. Tchernychova, and M. Rühle J. of Microscopy 210 2003 94
48. D.B. Williams, and C.B. Carter Transmission Electron Microscopy: Spectrometry 2009 Springer New York p. 581
49. E. Van Cappellen, and A. Schmitz Ultramicroscopy 41 1992 193
50. D.A. Muller Ultramicroscopy 78 1999 163
51. P. Rez, J.R. Alvarez, and C. Pickard Ultramicroscopy 78 1999 175
52. M.S. Moreno, K. Jorrisen, and J.J. Rehr Micron 38 2007 1
53. B. Ravel J. Synchrotron Rad. 8 2001 314
54. N. Serani, W. Pompe, and L.C. Ciacchi J. Phys. Chem. B 110 2006 14860
55. J. Liu Microscopy and Microanalysis 8 Suppl. 02 2002 1600