The interaction of an atomic force microscope tip with a nano-object: A model for determining the lateral force

Nanotechnology

Volumn 21, Issue 45, 2010, Pages

  Boer Duchemin, E ^a   Tranvouez, E ^a   Dujardin, G ^a  

^a INSTITUT DES SCIENCES MOLÉCULAIRES D ORSAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AFM TIP; ATOMIC FORCE MICROSCOPES; CADMIUM SELENIDES; CONTACT FORCES; CONTACT THEORY; EXPERIMENTAL SYSTEM; HAMAKER; LATERAL FORCE; MATERIAL PARAMETER;

CADMIUM; CADMIUM COMPOUNDS; NANORODS;

ATOMIC FORCE MICROSCOPY;

EID: 77958615823     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/21/45/455704     Document Type: Article

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