Is frequentist testing vulnerable to the base-rate fallacy

Philosophy of Science

Volumn 77, Issue 4, 2010, Pages 565-583

  Spanos, Aris ^a  

^a VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77958604724     PISSN: 00318248     EISSN: None     Source Type: Journal    
DOI: 10.1086/656009     Document Type: Article

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