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Journal of Adhesion Science and Technology

Volumn 24, Issue 15-16, 2010, Pages 2531-2544

The pull-off force and the work of adhesion: New challenges at the nanoscale

(2) Moore, Nathan W a Houston, J E a

a SANDIA NATIONAL LABORATORIES (United States)

Author keywords

contact mechanics; interfacial force microscopy; Nanomechanics; pull off force; work of adhesion

Indexed keywords

ADHESION PROBLEM; ATOMIC FORCE MICROSCOPES; CONTACT MECHANICS; DIAMOND INDENTER; FORCE SENSOR; FORCE-FEEDBACK; INTERFACIAL FORCE MICROSCOPY; MEMS/NEMS; NANO SCALE; NANO-SCALE GEOMETRIES; POLYMER SURFACES; PULL-OFF FORCES; SELF-BALANCING; WORK OF ADHESION;

ATOMIC FORCE MICROSCOPY; MECHANICS; NANOCANTILEVERS; NANOSTRUCTURED MATERIALS; SENSORS; SURFACES;

ADHESION;

EID: 77958547077 PISSN: 01694243 EISSN: 15685616 Source Type: Journal
DOI: 10.1163/016942410X508325 Document Type: Article

Times cited : (20)

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