Properties of new low melting point quaternary ammonium salts with bis(trifluoromethanesulfonyl)imide anion

Journal of Molecular Structure

Volumn 983, Issue 1-3, 2010, Pages 82-92

  Kärnä, Minna ^a   Lahtinen, Manu ^a   Kujala, Anna ^a   Hakkarainen, Pirkko Leena ^a   Valkonen, Jussi ^a  

^a UNIVERSITY OF JYVÄSKYLÄ   (Finland)

Author keywords

Bis(trifluoromethanesulfonyl)imide (TFSI); Ionic liquids; Physicochemical properties; Quaternary ammonium salt; Thermal analysis; X ray diffraction

Indexed keywords

AMBIENT TEMPERATURES; BIS(TRIFLUOROMETHANE SULFONYL)IMIDE; BULK POWDERS; CONDUCTIVITY MEASUREMENTS; CRYSTALLINITIES; ELEMENTAL ANALYSIS; FREEZING POINT; HEAT TRANSFER FLUIDS; HIGH CONDUCTIVITY; HIGH CRYSTALLINITY; HIGH-TEMPERATURE SYNTHESIS; IN-SITU; LIQUID RANGE; LOW MELTING POINT; LOW TEMPERATURES; LOW VISCOSITY; MASS SPECTROSCOPY; NMR TECHNIQUES; PHYSICOCHEMICAL PROPERTIES; PHYSICOCHEMICAL PROPERTY; POWDER DIFFRACTION; POWDER X RAY DIFFRACTION; QUATERNARY AMMONIUM; QUATERNARY AMMONIUM SALT; RESIDUAL WATER CONTENT; ROOM TEMPERATURE; ROOM TEMPERATURE IONIC LIQUIDS; STRUCTURAL SIMILARITY; THERMAL ANALYSIS; THERMOANALYTICAL METHODS; X-RAY SINGLE-CRYSTAL DIFFRACTION;

AMMONIUM COMPOUNDS; DIFFRACTION; HEAT TRANSFER; HIGH TEMPERATURE APPLICATIONS; IONS; MASS SPECTROMETRY; SALTS; SINGLE CRYSTALS; THERMOANALYSIS; VISCOSITY; WATER CONTENT; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; X RAYS;

IONIC LIQUIDS;

EID: 77958487601     PISSN: 00222860     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.molstruc.2010.08.036     Document Type: Article

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