Multiparametric scaling of diffraction intensities

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 59, Issue 3, 2003, Pages 228-234

  Otwinowski, Zbyszek ^a   Borek, Dominika ^a   Majewski, Wladyslaw ^a   Minor, Wladek ^b  

^a UNIVERSITY OF TEXAS SOUTHWESTERN MEDICAL CENTER   (United States)

^b UNIVERSITY OF VIRGINIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTIC METHOD; ARTICLE; CRYSTAL; DIFFRACTION; MATHEMATICAL MODEL; RADIATION DOSE; TEMPERATURE SENSITIVITY;

ALGORITHMS; CALIBRATION; CRYSTALLOGRAPHY, X-RAY; MODELS, STATISTICAL;

EID: 0038414570     PISSN: 01087673     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108767303005488     Document Type: Article

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