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Volumn 519, Issue 2, 2010, Pages 943-946

Direct observation of oxygen vacancy and its effect on the microstructure, electronic and transport properties of sputtered LaNiO3 - δ films on Si substrates

(2) Qiao, Liang a Bi, Xiaofang a

a BEIHANG UNIVERSITY (China)

Author keywords

Annealing; Crystal structure; Oxygen vacancies; Perovskites; Transport property

Indexed keywords

ANNEALING PROCESS; CORE-LEVEL PHOTOELECTRON SPECTROSCOPY; DIRECT OBSERVATION; LATTICE OXYGEN; LOW OXYGEN PRESSURE; OXYGEN CONTENT; RADIO FREQUENCY SPUTTERING; SI SUBSTRATES; TRANSPORT BEHAVIOR; TRANSPORT MEASUREMENTS; VACUUM CONDITION; VALENCE BAND SPECTRA; X-RAY DIFFRACTION MEASUREMENTS;

ANNEALING; CRYSTAL STRUCTURE; ELECTRONIC STRUCTURE; OXYGEN; SPUTTERING; TRANSPORT PROPERTIES; VACANCIES; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

OXYGEN VACANCIES;

EID: 77958471639 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2010.08.129 Document Type: Article

Times cited : (47)

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