Nanomechanical characterization of skin and skin cream

Journal of Microscopy

Volumn 240, Issue 2, 2010, Pages 135-144

  Bhushan, B ^a   Tang, W ^a,b   Ge, S ^b  

^a OHIO STATE UNIVERSITY   (United States)

^b CHINA UNIVERSITY OF MINING AND TECHNOLOGY   (China)

Author keywords

In situ tension measurement; Nanoindentation; Nanoscratch; Skin; Skin cream

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELASTIC MODULI; NANOTECHNOLOGY;

ATOMIC FORCE; HARDNESS AND ELASTIC MODULUS; IN SITU TENSION MEASUREMENT; IN-SITU TENSION; NANO INDENTATION; NANO-SCRATCH; NANOMECHANICAL CHARACTERIZATION; PATHOLOGICAL SITUATIONS; SKIN CREAMS; TENSION MEASUREMENT;

HARDNESS;

COSMETIC; SKIN CREAM; UNCLASSIFIED DRUG;

ARTICLE; ATOMIC FORCE MICROSCOPY; ELASTICITY; HARDNESS; HUMAN; NANOANALYSIS; PRIORITY JOURNAL; SKIN; SKIN CARE; TENSILE STRENGTH;

EID: 77958184717     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2010.03407.x     Document Type: Article

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