A scalable RFCMOS noise model

IEEE Transactions on Microwave Theory and Techniques

Volumn 57, Issue 1, 2009, Pages 1009-1019

  Tong, Ah Fatt ^a   Lim, Wei Meng ^b   Yeo, Kiat Seng ^b   Sia, Choon Beng ^c   Zhou, Wen Cong ^a,d  

^a Advanced RFIC S Pte Ltd   (Singapore)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^c Cascade Microtech Inc   (United States)

^d INSTITUTE OF MICROELECTRONICS   (Singapore)

Author keywords

BSIM3v3; HF noise modeling; High frequency (HF) noise model; RF MOSFET; RFCMOS; Verilog A

Indexed keywords

BSIM3V3; HIGH-FREQUENCY NOISE; NOISE MODELING; RF MOSFETS; RF-CMOS; VERILOG-A;

ACOUSTIC NOISE; ACOUSTIC NOISE MEASUREMENT; DESIGN; INTEGRATED CIRCUIT MANUFACTURE; MEASUREMENT THEORY; MOSFET DEVICES; PROCESS ENGINEERING; SCALABILITY; THERMAL NOISE;

COMPUTER SIMULATION;

EID: 77958105930     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

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