3D EBSD characterization of deformation structures in commercial purity aluminum

Materials Characterization

Volumn 61, Issue 11, 2010, Pages 1203-1210

  Lin, F X ^a,b   Godfrey, A ^a   Jensen, D Juul ^b   Winther, G ^b  

^a TSINGHUA UNIVERSITY   (China)

^b TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

Aluminum; EBSD; Microstructure; Orientation spread; Serial sectioning

Indexed keywords

3D EBSD; COMMERCIAL PURITY ALUMINUM; DEFORMATION STRUCTURE; EBSD; ELECTRON BACK-SCATTERED DIFFRACTION; ELECTROPOLISHING; INDUCED ORIENTATION; MECHANICAL POLISHING; ORIENTATION MAPPING; ORIENTATION SPREAD; SERIAL SECTION; SERIAL SECTIONING; SURFACE QUALITIES; THREE DIMENSIONAL MORPHOLOGY; THREE DIMENSIONAL VISUALIZATION; THREE DIMENSIONS; THREE-DIMENSIONAL DATA; TWO-DIMENSIONAL MAP;

DEFORMATION; ELECTROLYTIC POLISHING; MICROSTRUCTURE; THREE DIMENSIONAL; TWO DIMENSIONAL; VISUALIZATION;

ALUMINUM;

EID: 77957986618     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchar.2010.07.013     Document Type: Article

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