Post-silicon power characterization using thermal infrared emissions

Proceedings of the International Symposium on Low Power Electronics and Design

Volumn , Issue , 2010, Pages 331-336

  Cochran, Ryan ^a   Nazma, Abdullah Nowroz ^a   Reda, Sherief ^a  

^a Brown University   (United States)

Author keywords

Power characterization; Thermal infrared emissions

Indexed keywords

CHARACTERIZATION TECHNIQUES; CIRCUIT BLOCKS; CIRCUIT DESIGNERS; CRITICAL TASKS; HEAT DIFFUSIONS; INFRA-RED CAMERAS; INJECTED POWER; LOW-PASS FILTERING; MICRO-HEATERS; NOVEL METHODOLOGY; POST-SILICON; POWER ANALYSIS; POWER CHARACTERIZATION; POWER CONSUMPTION; POWER INVERSION; POWER PATTERN; PROGRAMMABLE CIRCUITS; REGULARIZATION THEORY; SILICON CHIP; SILICON DIE; THERMAL EMISSIONS; THERMAL INFRARED;

DESIGN; MEASUREMENT ERRORS; POWER ELECTRONICS;

INFRARED RADIATION;

EID: 77957961013     PISSN: 15334678     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1840845.1840914     Document Type: Conference Paper

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