SEILA: Soft error immune latch for mitigating multi-node-SEU and local-clock-SET

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2010, Pages 218-223

  Uemura, Taiki ^a   Tosaka, Yoshiharu ^a   Matsuyama, Hideya ^a   Shono, Ken ^a   Uchibori, Chihiro J ^b   Takahisa, Keiji ^c   Fukuda, Mitsuhiro ^c   Hatanaka, Kichiji ^c  

^a FUJITSU LABORATORIES LTD   (Japan)

^b FUJITSU LABORATORIES OF AMERICA   (United States)

^c OSAKA UNIVERSITY   (Japan)

Author keywords

Charge sharing; Local clock; MNSEU; SET; SETLC; SEU; Soft error

Indexed keywords

CHARGE SHARING; LOCAL-CLOCK; MNSEU; SET; SETLC; SEU; SOFT-ERROR;

CLOCKS; RELIABILITY;

TRANSIENTS;

EID: 77957894800     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IRPS.2010.5488827     Document Type: Conference Paper

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