III-V photonic crystal wire cavity laser on silicon wafer

Journal of the Optical Society of America B: Optical Physics

Volumn 27, Issue 10, 2010, Pages 2146-2150

  Halioua, Yacine ^a,b   Bazin, Alexandre ^a   Monnier, Paul ^a   Karle, Timothy J ^a   Sagnes, Isabelle ^a   Roelkens, Gunther ^b   Van Thourhout, Dries ^b   Raineri, Fabrice ^a,c   Raj, Rama ^a  

^a UNIV PARIS SUD   (France)

^b GHENT UNIVERSITY   (Belgium)

^c UNIVERSITÉ PARIS DESCARTES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

PHOTONIC CRYSTALS; Q FACTOR MEASUREMENT; SILICON WAFERS; WAFER BONDING; WIRE;

CAVITY LASERS; EXPERIMENTAL CHARACTERIZATION; GEOMETRICAL PARAMETERS; INP; LASER CAVITY; LOW-THRESHOLD LASERS; Q-FACTORS; RESONANT MODE;

SEMICONDUCTING SILICON COMPOUNDS;

EID: 77957861955     PISSN: 07403224     EISSN: None     Source Type: Journal    
DOI: 10.1364/JOSAB.27.002146     Document Type: Article

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