Microwave-induced electromigration in multicomponent metallic alloys

IEEE MTT-S International Microwave Symposium Digest

Volumn , Issue , 2010, Pages 1440-1443

  Vaucher, Sébastien ^a   Bernau, Laurent ^a   Stir, Manuela ^a   Ishizaki, Kotaro ^a   Catala Civera, José Manuel ^b   Nicula, Radu ^a  

^a SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^b UNIVERSITAT POLITÈCNICA DE VALÈNCIA   (Spain)

Author keywords

Amorphous magnetic materials; Diffusion; Electromagnetic heating; Electromigration; X ray diffraction

Indexed keywords

ALLOY RIBBONS; AMORPHOUS MAGNETIC MATERIALS; CHEMICAL COMPOSITION ANALYSIS; ELECTROMAGNETIC HEATING; GLASSY MATRICES; IN-SITU; METALLIC ALLOYS; MICROWAVE EXPOSURE; MICROWAVE FIELD; MULTICOMPONENTS; NANO-SIZED; NANOCRYSTALLINES; PRIMARY CRYSTALLIZATION; SCANNING ELECTRONS; SURFACE CLUSTERS; TIME RESOLVED TECHNIQUE; TIME-RESOLVED;

CERIUM ALLOYS; CRYSTALLIZATION; DIFFRACTION; ELECTROMAGNETISM; ELECTROMIGRATION; ENERGY DISPERSIVE SPECTROSCOPY; HEATING; MAGNETIC DEVICES; MAGNETIC MATERIALS; METALLIC GLASS; MICROWAVES; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY POWDER DIFFRACTION; X RAYS;

NANOCRYSTALLINE ALLOYS;

EID: 77957787949     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MWSYM.2010.5517705     Document Type: Conference Paper

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