Spin-split electronic states in graphene: Effects due to lattice deformation, Rashba effect, and adatoms by first principles

Physical Review B - Condensed Matter and Materials Physics

Volumn 82, Issue 12, 2010, Pages

  Abdelouahed, Samir ^a   Ernst, A ^a   Henk, J ^a   Maznichenko, I V ^b   Mertig, I ^a,b  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^b MARTIN LUTHER UNIVERSITY HALLE WITTENBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77957748095     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.82.125424     Document Type: Article

References (42)

1. A. Bostwick, T. Ohta, T. Seyller, K. Horn, and E. Rotenberg, Nat. Phys. 3, 36 (2007). 10.1038/nphys477
2. S. V. Morozov, K. S. Novoselov, F. Schedin, D. Jiang, A. A. Firsov, and A. K. Geim, Phys. Rev. B 72, 201401 (R) (2005). 10.1103/PhysRevB.72.201401
3. Y. Zhang, Y.-W. Tan, H. L. Stormer, and P. Kim, Nature (London) 438, 201 (2005). 10.1038/nature04235
4. M.-H. Liu, G. Bihlmayer, S. Blügel, and C.-R. Chang, Phys. Rev. B 76, 121301 (R) (2007). 10.1103/PhysRevB.76.121301
5. Y. A. Bychkov and E. I. Rashba, Sov Phys. JETP 39, 78 (1984).
6. Yu. M. Koroteev, G. Bihlmayer, J. E. Gayone, E. V. Chulkov, S. Blügel, P. M. Echenique, and Ph. Hofmann, Phys. Rev. Lett. 93, 046403 (2004). 10.1103/PhysRevLett.93.046403
7. C. R. Ast, J. Henk, A. Ernst, L. Moreschini, M. C. Falub, D. Pacilé, P. Bruno, K. Kern, and M. Grioni, Phys. Rev. Lett. 98, 186807 (2007). 10.1103/PhysRevLett.98.186807
8. G. Bihlmayer, S. Blügel, and E. V. Chulkov, Phys. Rev. B 75, 195414 (2007). 10.1103/PhysRevB.75.195414
9. H. Mirhosseini, I. V. Maznichenko, S. Abdelouahed, S. Ostanin, A. Ernst, I. Mertig, and J. Henk, Phys. Rev. B 81, 073406 (2010). 10.1103/PhysRevB.81. 073406
10. G. Liang, N. Neophytou, D. E. Nikonov, and M. S. Lundstrom, IEEE Trans. Electron Devices 54, 677 (2007). 10.1109/TED.2007.891872
11. http://www.flapw.de, see also S. Blügel and G. Bihlmayer, Computational Nanoscience: Do It Yourself, NIC Series Vol. 31 (John von Neumann Institute for Computing, Jülich, 2006), p. 85.
12. V. L. Moruzzi, J. F. Janak, and A. R. Williams, Calculated Electronic Properties of Metals (Pergamon Press, New York, 1978).
13. S. Abdelouahed, N. Baadji, and M. Alouani, Phys. Rev. B 75, 094428 (2007). 10.1103/PhysRevB.75.094428
14. Electron Scattering in Solid Matter, in edited by, J. Zabloudil,,, R. Hammerling,,, L. Szunyogh,, and, P. Weinberger, (Springer, Berlin, 2005). 10.1007/b138290
15. J. Henk, in Handbook of Thin Film Materials, edited by, H. S. Nalwa, (Academic Press, San Diego, 2001), Vol. 2, Chap., p. 479. 10.1016/B978- 012512908-4/50029-1
16. J. P. Perdew and Y. Wang, Phys. Rev. B 45, 13244 (1992). 10.1103/PhysRevB.45.13244
17. K. S. Novoselov, A. K. Geim, S. V. Morozov, D. Jiang, M. I. Katsnelson, I. V. Grigorieva, S. V. Dubonos, and A. A. Firsov, Nature 438, 197 (2005). 10.1038/nature04233
18. C. Berger, Z. Song, X. Li, X. Wu, N. Brown, C. Naud, D. Mayou, T. Li, J. Hass, A. N. Marchenkov, E. H. Conrad, P. N. First, and W. A. de Heer, Science 312, 1191 (2006). 10.1126/science.1125925
19. R. M. Ribeiro, V. M. Pereira, N. M. R. Peres, P. R. Briddon, and A. H. Castro Neto, New J. Phys. 11, 115002 (2009). 10.1088/1367-2630/11/11/115002
20. J. Buschbeck, I. Opahle, M. Richter, U. K. Rößler, P. Klaer, M. Kallmayer, H. J. Elmers, G. Jakob, L. Schultz, and S. Fähler, Phys. Rev. Lett. 103, 216101 (2009). 10.1103/PhysRevLett.103.216101
21. S. Y. Zhou, G.-H. Gweon, A. V. Fedorov, P. N. First, W. A. de Heer, D.-H. Lee, F. Guinea, A. H. Castro Neto, and A. Lanzara, Nature Mater. 6, 770 (2007). 10.1038/nmat2003
22. S. Datta and B. Das, Appl. Phys. Lett. 56, 665 (1990). 10.1063/1.102730
23. F. Reinert, J. Phys.: Condens. Matter 15, S693 (2003). 10.1088/0953-8984/15/5/321
24. D. P. DiVincenzo and E. J. Mele, Phys. Rev. B 29, 1685 (1984). 10.1103/PhysRevB.29.1685
25. C. L. Kane and E. J. Mele, Phys. Rev. Lett. 95, 226801 (2005). 10.1103/PhysRevLett.95.226801
26. M. Gmitra, S. Konschuh, C. Ertler, C. Ambrosch-Draxl, and J. Fabian, Phys. Rev. B 80, 235431 (2009). 10.1103/PhysRevB.80.235431
27. J. C. Slonczewski and P. R. Weiss, Phys. Rev. 109, 272 (1958). 10.1103/PhysRev.109.272
28. J. Henk, A. Ernst, and P. Bruno, Phys. Rev. B 68, 165416 (2003). 10.1103/PhysRevB.68.165416
29. E. I. Rashba, Phys. Rev. B 79, 161409 (R) (2009). 10.1103/PhysRevB.79. 161409
30. M.-H. Liu and C.-R. Chang, Phys. Rev. B 80, 241304 (R) (2009). 10.1103/PhysRevB.80.241304
31. A. Fasolino, J. H. Los, and M. I. Kastnelson, Nature Mater. 6, 858 (2007). 10.1038/nmat2011
32. F. Guinea, M. I. Katsnelson, and M. A. H. Vozmediano, Phys. Rev. B 77, 075422 (2008). 10.1103/PhysRevB.77.075422
33. C. Ammer, K. Meinel, H. Wolter, A. Beckmann, and H. Neddermeyer, Surf. Sci. 375, 302 (1997). 10.1016/S0039-6028(97)01288-0
34. P. Y. Yu and M. Cardona, Fundamentals of Semiconductors: Physics and Materials Properties (Springer, New York, 2005).
35. A. H. Castro Neto and F. Guinea, Phys. Rev. Lett. 103, 026804 (2009). 10.1103/PhysRevLett.103.026804
36. A. Varykhalov, J. Sanchez-Barriga, A. M. Shikin, C. Biswas, E. Vescovo, A. Rybkin, D. Marchenko, and O. Rader, Phys. Rev. Lett. 101, 157601 (2008). 10.1103/PhysRevLett.101.157601
37. Y. S. Dedkov, M. Fonin, U. Rüdiger, and C. Laubschat, Phys. Rev. Lett. 100, 107602 (2008). 10.1103/PhysRevLett.100.107602
38. I. Gierz, T. Suzuki, R. T. Weitz, D. S. Lee, B. Krauss, C. Riedl, U. Starke, H. Höchst, J. H. Smet, C. R. Ast, and K. Kern, Phys. Rev. B 81, 235408 (2010). 10.1103/PhysRevB.81.235408
39. G. Bertoni, L. Calmels, A. Altibelli, and V. Serin, Phys. Rev. B 71, 075402 (2005). 10.1103/PhysRevB.71.075402
40. G. Giovannetti, P. A. Khomyakov, G. Brocks, V. M. Karpan, J. van den Brink, and P. J. Kelly, Phys. Rev. Lett. 101, 026803 (2008). 10.1103/PhysRevLett.101.026803
41. M. Weser, Y. Rehder, K. Horn, M. Sicot, M. Fonin, A. B. Preobrajenski, E. N. Voloshina, E. Georing, and Y. S. Dedkov, Appl. Phys. Lett. 96, 012504 (2010). 10.1063/1.3280047
42. O. Rader, A. Varykhalov, J. Sanchez-Barriga, D. Marchenko, A. Rybkin, and A. M. Shikin, Phys. Rev. Lett. 102, 057602 (2009). 10.1103/PhysRevLett.102. 057602