High-resolution LEED analysis of strained Cu layers on Ru(0001)

Surface Science

Volumn 375, Issue 2-3, 1997, Pages 302-314

  Ammer, Ch ^a   Meinel, K ^a   Wolter, H ^a   Beckmann, A ^a   Neddermeyer, H ^a  

^a MARTIN LUTHER UNIVERSITY HALLE WITTENBERG   (Germany)

Author keywords

Copper; Epitaxy; Growth; Low energy electron diffraction (LEED); Ruthenium; Scanning tunnelling microscopy; Surface structure

Indexed keywords

COPPER; CRYSTAL LATTICES; EPITAXIAL GROWTH; LOW ENERGY ELECTRON DIFFRACTION; RELAXATION PROCESSES; RUTHENIUM; SCANNING TUNNELING MICROSCOPY; SURFACE STRUCTURE;

FILM SUPERSTRUCTURE;

METALLIC FILMS;

EID: 0031124359     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)01288-0     Document Type: Article

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