Nanoscale polarization relaxation of epitaxial BiFeO3 thin film

Thin Solid Films

Volumn 518, Issue 24 SUPPL., 2010, Pages

  Chen, Weigang ^a   You, Lu ^a   Chen, Gaofeng ^a   Chua, Ngeah Theng ^a   Guan, Ong Hock ^a   Zou, Xi ^a   Wang, Junling ^a   Chen, Lang ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

Bismuth ferrite; Ferroelectricity; Piezoresponse force microscopy; Polarization relaxation

Indexed keywords

AS-GROWN FILMS; BISMUTH FERRITES; BOTTOM ELECTRODES; DEPOLARIZATION FIELDS; DOMAIN PATTERN; DOMAIN-WALL PROPAGATION; DRIVING FORCES; DUAL FREQUENCY; NANO SCALE; NANOSCALE POLARIZATION RELAXATION; NUCLEATION CENTER; PIEZORESPONSE FORCE MICROSCOPY; POLARIZATION RELAXATION; SRTIO; STRETCHED EXPONENTIAL; THICK EPITAXIAL; TIME-DEPENDENT;

BISMUTH; FERRITE; FERROELECTRICITY; NANOSTRUCTURED MATERIALS; NUCLEATION; RELAXATION PROCESSES; THIN FILMS;

DEPOLARIZATION;

EID: 77957691029     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.03.089     Document Type: Article

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