Characterization of a large-area PVDF thin film for electro-mechanical and ultrasonic sensing applications

Sensors and Actuators, A: Physical

Volumn 163, Issue 1, 2010, Pages 164-171

  Rathod, V T ^a   Mahapatra, D Roy ^a   Jain, Anjana ^b   Gayathri, A ^b  

^a INDIAN INSTITUTE OF SCIENCE   (India)

^b SURFACE ENGINEERING DIVISION   (India)

Author keywords

Lamb wave; Piezoelectricity; PVDF; Structural health monitoring; Thin film; Ultrasonic

Indexed keywords

DC FIELD; DISTRIBUTED SENSING; ELECTRO-MECHANICAL; HIGH FREQUENCY DYNAMICS; HOT-PRESS METHOD; LAMB WAVE; LINEAR STRAINS; MECHANICAL IMPEDANCES; METAL BEAM; PVDF; PVDF FILMS; PVDF SENSOR; PZT SENSORS; PZT WAFER; QUASI-STATIC; QUASI-STATIC STRAINS; REFERENCE SIGNALS; RESONANCE PATTERNS; SENSOR SENSITIVITY; SIGNAL AMPLITUDE; STRUCTURAL HEALTH; SURFACE PATTERN; ULTRASONIC SENSING; VOLTAGE OUTPUT; VOLTAGE SIGNALS;

CRYSTALLOGRAPHY; ELASTIC WAVES; FILM PREPARATION; HEALTH; PIEZOELECTRIC DEVICES; PIEZOELECTRICITY; RESONANCE; SENSORS; THERMOMECHANICAL TREATMENT; THIN FILMS; ULTRASONIC WAVES; ULTRASONICS; VAPOR DEPOSITION; WAFER BONDING;

STRUCTURAL HEALTH MONITORING;

EID: 77957659313     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sna.2010.08.017     Document Type: Article

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