A new method for quantitative petrography based on image processing of chemical element maps: Part I. Mineral mapping applied to compacted bentonites

American Mineralogist

Volumn 95, Issue 10, 2010, Pages 1379-1388

  Prêt, Dimitri ^a,b   Sammartino, Stephane ^b,e   Beaufort, Daniel ^a   Meunier, Alain ^a   Fialin, Michel ^c   Michot, Laurent J ^d  

^a STATION DE RADIOASTRONOMIE DE NANÇAY   (France)

^b Etudes Recherches Materiaux   (France)

^c SORBONNE UNIVERSITÉ   (France)

^d Faculté des Sciences et Technologies   (France)

^e UNIVERSITY OF AVIGNON   (France)

Author keywords

Chemical map; Electron microprobe; Image analysis; Microstructure; Mineral map; Modal analysis; Software; Texture

Indexed keywords

BENTONITE; CHEMICAL ELEMENTS; COMPUTER SOFTWARE; IMAGE ANALYSIS; IMAGE PROCESSING; MICROSTRUCTURE; MODAL ANALYSIS; TEXTURES;

COMPACTED BENTONITE; ELECTRON MICROPROBES; ELECTRON PROBE MICRO ANALYZER; ENGINEERED MATERIALS; SCALE HETEROGENEITIES; SPATIAL RESOLUTION; TEXTURAL HETEROGENEITIES; THRESHOLDING METHODS;

CHEMICAL ANALYSIS;

BENTONITE; CHEMICAL ELEMENT; ELECTRON PROBE ANALYSIS; HETEROGENEITY; IMAGE ANALYSIS; MAP; MICROSTRUCTURE; PETROGRAPHY; SOFTWARE; SOLID SOLUTION; SPATIAL RESOLUTION; TEXTURE;

EID: 77957592817     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am.2010.3431     Document Type: Article

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