Modern SEM-based mineral liberation analysis

International Journal of Mineral Processing

Volumn 84, Issue 1-4, 2007, Pages 310-320

  Fandrich, Rolf ^a   Gu, Ying ^a   Burrows, Debra ^a   Moeller, Kurt ^a  

^a JKTech Pty Ltd   (Australia)

Author keywords

Image analysis; Mineral liberation analysis; Scanning electron microscope

Indexed keywords

IMAGE ANALYSIS; MINERALOGY; OPTICAL MICROSCOPY; SCANNING ELECTRON MICROSCOPY;

MINERAL LIBERATION ANALYSIS; MINERAL PROCESSING; ROUTINE ANALYSIS;

MINING;

EID: 34548511845     PISSN: 03017516     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.minpro.2006.07.018     Document Type: Article

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