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Volumn 64, Issue 24, 2010, Pages 2707-2709
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The characterization of fluorine doped tin oxide films by Fourier Transformation Infrared spectrum
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Author keywords
Defects; Plasma frequency; Spray pyrolysis; Thin films
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Indexed keywords
CUTOFF WAVELENGTHS;
DEFECT MODEL;
FLUORINE-DOPED;
FLUORINE-DOPED TIN OXIDE FILMS;
FOURIER TRANSFORMATION INFRARED SPECTRUM;
FREE ELECTRON;
FT-IR SPECTRUM;
PLASMA FREQUENCY;
SPRAY-PYROLYSIS TECHNIQUES;
CARRIER CONCENTRATION;
DEFECTS;
FLUORINE;
FOURIER ANALYSIS;
FOURIER TRANSFORMS;
OXIDE FILMS;
OXYGEN;
OXYGEN VACANCIES;
PLASMA WAVES;
REFLECTION;
SPECTROSCOPY;
THIN FILMS;
TIN;
TIN OXIDES;
TITANIUM COMPOUNDS;
SPRAY PYROLYSIS;
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EID: 77957202085
PISSN: 0167577X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.matlet.2010.08.065 Document Type: Article |
Times cited : (19)
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References (19)
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