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Volumn 64, Issue 24, 2010, Pages 2707-2709

The characterization of fluorine doped tin oxide films by Fourier Transformation Infrared spectrum

Author keywords

Defects; Plasma frequency; Spray pyrolysis; Thin films

Indexed keywords

CUTOFF WAVELENGTHS; DEFECT MODEL; FLUORINE-DOPED; FLUORINE-DOPED TIN OXIDE FILMS; FOURIER TRANSFORMATION INFRARED SPECTRUM; FREE ELECTRON; FT-IR SPECTRUM; PLASMA FREQUENCY; SPRAY-PYROLYSIS TECHNIQUES;

EID: 77957202085     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2010.08.065     Document Type: Article
Times cited : (19)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.