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Volumn 507, Issue 2, 2010, Pages 557-562
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Optical spectroscopy, optical conductivity, dielectric properties and new methods for determining the gap states of CuSe thin films
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Author keywords
CuSe; Determination of the gap states; Dielectric properties; Optical conductivity; Optical dispersion parameters; Relaxation time; Thin film
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Indexed keywords
ABSORPTION INDEXES;
ABSORPTION REGION;
AMORPHOUS STRUCTURES;
ANOMALOUS DISPERSION;
BAND GAPS;
CUSE;
DISPERSION CURVES;
GAP STATE;
NORMAL DISPERSION;
OPTICAL DISPERSION;
OPTICAL SPECTROSCOPY;
STRUCTURAL AND OPTICAL PROPERTIES;
WAVELENGTH RANGES;
ABSORPTION;
AMORPHOUS FILMS;
DIELECTRIC PROPERTIES;
DIFFRACTION;
DISPERSION (WAVES);
ENERGY GAP;
HOLOGRAPHIC INTERFEROMETRY;
LIGHT REFRACTION;
OPTICAL CONDUCTIVITY;
RAMAN SPECTROSCOPY;
REFRACTIVE INDEX;
REFRACTOMETERS;
RELAXATION PROCESSES;
THIN FILMS;
VAPOR DEPOSITION;
X RAY DIFFRACTION;
DISPERSIONS;
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EID: 77957150657
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2010.08.022 Document Type: Article |
Times cited : (173)
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References (41)
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