Residual stress relaxation measurements across interfaces at macro-and micro-scales using slitting and DIC

Journal of Physics: Conference Series

Volumn 181, Issue 1, 2009, Pages

  Blair, A ^a   Daynes, N ^a   Hamilton, D ^a   Horne, G ^a   Heard, P J ^a   Hodgson, D Z L ^a   Scott, T B ^a   Shterenlikht, A ^a  

^a UNIVERSITY OF BRISTOL   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; COMPUTERIZED TOMOGRAPHY; GRAIN BOUNDARIES; IMAGE ANALYSIS; INVERSE PROBLEMS; ION BEAMS; RESIDUAL STRESSES; SLITTING; SPECKLE; STRAIN MEASUREMENT; STRESS RELAXATION; VIBRATION ANALYSIS;

DIGITAL IMAGE CORRELATION METHODS; DIGITAL IMAGE CORRELATIONS; ELECTRON BACKSCATTERING DIFFRACTION; FINITE ELEMENT SIMULATIONS; HETEROGENEOUS MATERIALS; RELAXATION OF RESIDUAL STRESS; THREE DIMENSIONAL IMAGES; TWO-DIMENSIONAL IMAGE CORRELATIONS;

FINITE ELEMENT METHOD;

EID: 77957076641     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/181/1/012078     Document Type: Conference Paper

References (10)

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