Measurement of residual stress in thin-sized steel wires by using focused ion beam and digital image correlation method

Advanced Materials Research

Volumn 24-25, Issue , 2007, Pages 1187-1190

  Yang, Yo Sep ^a   Bae, Jong Gu ^b   Park, Chan Gyung ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

^b KISWIRE Ltd   (South Korea)

Author keywords

Digital image correlation (DIC); Focused ion beam (FIB); Residual stress; Steel wire

Indexed keywords

CORRELATION METHODS; FOCUSED ION BEAMS; IMAGE ANALYSIS; IONS; MILLING (MACHINING); RESIDUAL STRESSES; SCANNING ELECTRON MICROSCOPY; STRAIN MEASUREMENT;

D. DIGITAL IMAGE CORRELATION (DIC); DIGITAL CORRELATION; DIGITAL IMAGE CORRELATION METHODS; DISPLACEMENT FIELD; EXPERIMENTAL PROCEDURE; FOCUSED ION BEAM MILLING; HIGH RESOLUTION SCANNING; STEEL WIRE;

WIRE;

EID: 57649084593     PISSN: 10226680     EISSN: None     Source Type: Book Series    
DOI: 10.4028/0-87849-463-4.1187     Document Type: Conference Paper

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