Rietveld texture analysis by neutron diffraction of highly absorbing materials

Powder Diffraction

Volumn 21, Issue 2, 2006, Pages 114-117

  Volz, H M ^a   Vogel, S C ^a   Necker, C T ^a   Roberts, J A ^a   Lawson, A C ^a   Williams, D J ^a   Daemen, L L ^a   Lutterotti, L ^b   Pehl, J ^c  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF TRENTO   (Italy)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORBING MATERIALS; ABSORPTION CORRECTIONS; ABSORPTION CROSS SECTIONS; HEXAGONAL CLOSE PACKED; NEUTRON POWDER DIFFRACTOMETER; ORIENTATION DISTRIBUTION FUNCTION; SPHERICAL HARMONICS; STRUCTURAL PARAMETER;

ERBIUM; FARM BUILDINGS; NEUTRON DIFFRACTION; NEUTRONS; RIETVELD ANALYSIS; TEXTURES; X RAY DIFFRACTION;

RIETVELD REFINEMENT;

EID: 33745494500     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1154/1.2204058     Document Type: Conference Paper

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