-
6
-
-
84956263829
-
-
Bean J.C., Feldman L.C., Fiory A.T., Nakahara S., and Robinson I.K. J. Vac. Sci. Technol. A2 (1984) 436
-
(1984)
J. Vac. Sci. Technol.
, vol.A2
, pp. 436
-
-
Bean, J.C.1
Feldman, L.C.2
Fiory, A.T.3
Nakahara, S.4
Robinson, I.K.5
-
14
-
-
0025386131
-
-
Chang S.J., Arbet V., Wang K.L., Bowman Jr. R.C., Adams P.M., Nayak D., and Woo J.C.C. J. Elec. Mat. 19 (1990) 125
-
(1990)
J. Elec. Mat.
, vol.19
, pp. 125
-
-
Chang, S.J.1
Arbet, V.2
Wang, K.L.3
Bowman Jr., R.C.4
Adams, P.M.5
Nayak, D.6
Woo, J.C.C.7
-
16
-
-
0007815754
-
-
Thin Solid Films 37 (1976) 249
-
(1976)
Thin Solid Films
, vol.37
, pp. 249
-
-
-
21
-
-
0000059047
-
-
Currie M.T., Samavedam S.B., Langdo T.A., Leitz C.W., and Fitzgerald E.A. Appl. Phys. Lett. 62 (1998) 1718
-
(1998)
Appl. Phys. Lett.
, vol.62
, pp. 1718
-
-
Currie, M.T.1
Samavedam, S.B.2
Langdo, T.A.3
Leitz, C.W.4
Fitzgerald, E.A.5
-
22
-
-
77956656363
-
-
DeCoteau M.D. Wilshaw P.R. Falster R. Proc. of 16th International Conference on Defects in Semiconductors, Materials Science Forum 83-87 1992 185
-
DeCoteau M.D. Wilshaw P.R. Falster R. Proc. of 16th International Conference on Defects in Semiconductors, Materials Science Forum 83-87 1992 185
-
-
-
-
29
-
-
0023120312
-
-
Dupuis R.D., Bean J.C., Brown J.M., Macrander A.T., Miller R.C., and Hopkins L.C. J. Elec. Mat. 16 (1986) 69
-
(1986)
J. Elec. Mat.
, vol.16
, pp. 69
-
-
Dupuis, R.D.1
Bean, J.C.2
Brown, J.M.3
Macrander, A.T.4
Miller, R.C.5
Hopkins, L.C.6
-
30
-
-
0024668417
-
-
Eaglesham D.J., Kvam E.P., Maher D.M., Humphreys C.J., and Bean J.C. Phil. Mag. A59 (1989) 1059
-
(1989)
Phil. Mag.
, vol.A59
, pp. 1059
-
-
Eaglesham, D.J.1
Kvam, E.P.2
Maher, D.M.3
Humphreys, C.J.4
Bean, J.C.5
-
33
-
-
33847716090
-
-
Fitzgerald E.A., Kirchner P.D., Proano R., Petit G.D., Woodall J.M., and Ast D.G. Appl. Phys. Lett. 52 (1988) 1496
-
(1988)
Appl. Phys. Lett.
, vol.52
, pp. 1496
-
-
Fitzgerald, E.A.1
Kirchner, P.D.2
Proano, R.3
Petit, G.D.4
Woodall, J.M.5
Ast, D.G.6
-
34
-
-
21544434863
-
-
Fitzgerald E.A., Watson G.P., Proano R.E., Ast D.G., Kirchner P.D., Pettit G.D., and Woodall J.M. J. Appl. Phys. 65 (1989) 2220
-
(1989)
J. Appl. Phys.
, vol.65
, pp. 2220
-
-
Fitzgerald, E.A.1
Watson, G.P.2
Proano, R.E.3
Ast, D.G.4
Kirchner, P.D.5
Pettit, G.D.6
Woodall, J.M.7
-
35
-
-
0343578945
-
-
Fitzgerald E.A., Xie Y.H., Green M.L., Brasen D., Kortan A.R., Michel J., Mie Y.J., and Weir B.E. Appl. Phys. Lett 59 (1991) 811
-
(1991)
Appl. Phys. Lett
, vol.59
, pp. 811
-
-
Fitzgerald, E.A.1
Xie, Y.H.2
Green, M.L.3
Brasen, D.4
Kortan, A.R.5
Michel, J.6
Mie, Y.J.7
Weir, B.E.8
-
39
-
-
0000440628
-
-
Proc. Roy. Soc A198 (1949) 216
-
(1949)
Proc. Roy. Soc
, vol.A198
, pp. 216
-
-
-
49
-
-
39849100352
-
-
Gosling T.J., Jain S.C., Willis J.R., Atkinson A., and Bullough R. Phil. Mag. A66 (1992) 119
-
(1992)
Phil. Mag.
, vol.A66
, pp. 119
-
-
Gosling, T.J.1
Jain, S.C.2
Willis, J.R.3
Atkinson, A.4
Bullough, R.5
-
52
-
-
77956673738
-
-
Private communication
-
Gosling, T. (1995). Private communication.
-
(1995)
-
-
Gosling, T.1
-
53
-
-
0000635593
-
-
Green M.X., Weir B.E., Brasen D., Hsieh Y.F., Higashi G., Feygenson A., Feldman L.C., and Headrick R.L. J. Appl. Phys. 69 (1991) 745
-
(1991)
J. Appl. Phys.
, vol.69
, pp. 745
-
-
Green, M.X.1
Weir, B.E.2
Brasen, D.3
Hsieh, Y.F.4
Higashi, G.5
Feygenson, A.6
Feldman, L.C.7
Headrick, R.L.8
-
54
-
-
77956654944
-
Properties of Strained and Relaxed SiGe
-
E. Kasper IEEE EMIS, London, England, p
-
Grinfeld M.A. and Sorolovitz, D.J. (1995). In Properties of Strained and Relaxed SiGe, E. Kasper IEEE EMIS Datareviews Series No.12, London, England, p. 3-16.
-
(1995)
Datareviews Series
, vol.12
, pp. 3-16
-
-
Grinfeld, M.A.1
Sorolovitz, D.J.2
-
57
-
-
0029276715
-
-
Harame D.L., Comfort J.H., Cressler J.D., Crabbe E.F., Sun Y.-C., Meyerson B.S., and Tice T. IEEE Trans. Elec. Dev. 42 (1995) 455
-
(1995)
IEEE Trans. Elec. Dev.
, vol.42
, pp. 455
-
-
Harame, D.L.1
Comfort, J.H.2
Cressler, J.D.3
Crabbe, E.F.4
Sun, Y.-C.5
Meyerson, B.S.6
Tice, T.7
-
58
-
-
0029274349
-
-
Harame D.L., Comfort J.H., Cressler J.D., Crabbe E.F., Sun Y.-C., Meyerson B.S., and Tice T. IEEE Trans. Elec. Dev. 42 (1995) 469
-
(1995)
IEEE Trans. Elec. Dev.
, vol.42
, pp. 469
-
-
Harame, D.L.1
Comfort, J.H.2
Cressler, J.D.3
Crabbe, E.F.4
Sun, Y.-C.5
Meyerson, B.S.6
Tice, T.7
-
60
-
-
77956661298
-
-
Bristol, England: Institute of Physics, 367.
-
Heggie M., and Jones R. Inst. Phys. Ser. Conf 87 (1987) Bristol, England: Institute of Physics, 367.
-
(1987)
Inst. Phys. Ser. Conf
, vol.87
-
-
Heggie, M.1
Jones, R.2
-
61
-
-
0003542751
-
Properties of Strained and Relaxed SiGe E. Kasper
-
IEEE EMIS, London, England, p
-
Herzog, H.-J. (1995). In Properties of Strained and Relaxed SiGe E. Kasper., IEEE EMIS Datareviews Series No.12, London, England, p. 49-53.
-
(1995)
Datareviews Series
, vol.12
, pp. 49-53
-
-
Herzog, H.-J.1
-
65
-
-
0000544495
-
-
Houghton D.C., Gibbings C.J., Tuppen C.G., Lyons M.H., and Halliwell M.A.G. Appl. Phys. Lett. 56 (1990) 460
-
(1990)
Appl. Phys. Lett.
, vol.56
, pp. 460
-
-
Houghton, D.C.1
Gibbings, C.J.2
Tuppen, C.G.3
Lyons, M.H.4
Halliwell, M.A.G.5
-
68
-
-
0023042985
-
-
Hull R., Bean J.C., Cerdeira F., Fiory A.T., and Gibson J.M. Appl. Phys. Lett. 48 (1986) 56
-
(1986)
Appl. Phys. Lett.
, vol.48
, pp. 56
-
-
Hull, R.1
Bean, J.C.2
Cerdeira, F.3
Fiory, A.T.4
Gibson, J.M.5
-
74
-
-
0000962311
-
-
Hull R., Bean J.C., Bonar J.M., Higashi G.S., Short K.T., Temkin H., and White A.E. Appl. Phys. Lett. 56 (1990) 2445
-
(1990)
Appl. Phys. Lett.
, vol.56
, pp. 2445
-
-
Hull, R.1
Bean, J.C.2
Bonar, J.M.3
Higashi, G.S.4
Short, K.T.5
Temkin, H.6
White, A.E.7
-
75
-
-
0000183092
-
-
Hull R., Bean J.C., Bahnck D., Peticolas L.J., Short K.T., and Unterwald E.C. J. Appl. Phys. 70 (1991) 2052
-
(1991)
J. Appl. Phys.
, vol.70
, pp. 2052
-
-
Hull, R.1
Bean, J.C.2
Bahnck, D.3
Peticolas, L.J.4
Short, K.T.5
Unterwald, E.C.6
-
76
-
-
0010032176
-
-
Hull R., Bean J.C., Noble D., Hoyt J., and Gibbons J.F. Appl. Phys. Lett. 59 (1991) 1585
-
(1991)
Appl. Phys. Lett.
, vol.59
, pp. 1585
-
-
Hull, R.1
Bean, J.C.2
Noble, D.3
Hoyt, J.4
Gibbons, J.F.5
-
77
-
-
77956690233
-
-
Hull R., Bean J.C., Higashi G.S., Green M.L., Peticolas L., Bahnck D., and Brasen D. Appl. Phys. Lett. 60 (1991) 1488
-
(1991)
Appl. Phys. Lett.
, vol.60
, pp. 1488
-
-
Hull, R.1
Bean, J.C.2
Higashi, G.S.3
Green, M.L.4
Peticolas, L.5
Bahnck, D.6
Brasen, D.7
-
79
-
-
36449002245
-
-
Hull R., Bean J.C., Peticolas L.J., Bahnck D., Weir B.E., and Feldman L.C. Appl. Phys. Lett 61 (1993) 2802
-
(1993)
Appl. Phys. Lett
, vol.61
, pp. 2802
-
-
Hull, R.1
Bean, J.C.2
Peticolas, L.J.3
Bahnck, D.4
Weir, B.E.5
Feldman, L.C.6
-
80
-
-
0003112808
-
-
Hull R., Bean J.C., Peticolas L.J., Weir B.E., Prabhakaran K., and Ogino T. Appl. Phys. Lett 65 (1994) 327
-
(1994)
Appl. Phys. Lett
, vol.65
, pp. 327
-
-
Hull, R.1
Bean, J.C.2
Peticolas, L.J.3
Weir, B.E.4
Prabhakaran, K.5
Ogino, T.6
-
81
-
-
77956696995
-
-
To be published
-
Hull, R., Quan, Y. Stach, E., Waltz-Flannigan, A., and Yoon, D. (1997). To be published.
-
(1997)
-
-
Hull, R.1
Quan, Y.2
Stach, E.3
Waltz-Flannigan, A.4
Yoon, D.5
-
87
-
-
0042871703
-
-
Jesson D.E., Chen K.M., Pennycook S.J., Thundat T., and Warmack R.J. Science 268 (1995) 1161
-
(1995)
Science
, vol.268
, pp. 1161
-
-
Jesson, D.E.1
Chen, K.M.2
Pennycook, S.J.3
Thundat, T.4
Warmack, R.J.5
-
88
-
-
84975421236
-
-
Jones R., Umerski A., Sitch P., Heggie M.L., and Oberg S. Phys. Stat. Sol. (A) 138 (1993) 369
-
(1993)
Phys. Stat. Sol. (A)
, vol.138
, pp. 369
-
-
Jones, R.1
Umerski, A.2
Sitch, P.3
Heggie, M.L.4
Oberg, S.5
-
91
-
-
0001689377
-
-
Pearsall T.P. (Ed), Academic Press, San Diego, CA
-
Kasper E., and Schaffler F. In: Pearsall T.P. (Ed). Strained Layer Superlattices: Materials Science and Technology, Semiconductors and Semimetals 33 (1991), Academic Press, San Diego, CA 223-311
-
(1991)
Strained Layer Superlattices: Materials Science and Technology, Semiconductors and Semimetals
, vol.33
, pp. 223-311
-
-
Kasper, E.1
Schaffler, F.2
-
92
-
-
0000816941
-
-
Knall J., Romano R.T., Biegelsen D.K., Bringans R.D., Chui H.C., Harris Jr. J.S., Treat D.W., and Bour D.P. 1. Appl. Phys. 76 (1994) 2697
-
(1994)
1. Appl. Phys.
, vol.76
, pp. 2697
-
-
Knall, J.1
Romano, R.T.2
Biegelsen, D.K.3
Bringans, R.D.4
Chui, H.C.5
Harris Jr., J.S.6
Treat, D.W.7
Bour, D.P.8
-
95
-
-
0008717109
-
-
Kvam E.P., Eaglesham D.J., Maher D.M., Humphreys C.J., and Bean J.C. Proc. Mat. Res. Soc 104 (1988) 623
-
(1988)
Proc. Mat. Res. Soc
, vol.104
, pp. 623
-
-
Kvam, E.P.1
Eaglesham, D.J.2
Maher, D.M.3
Humphreys, C.J.4
Bean, J.C.5
-
99
-
-
84950525734
-
-
Lee H.P., Huang Y.-H., Liu X., Lin H., Smith J.S., Weber E.R., Yu P., Wang S., and Lilliental-Weber Z. Proc. Mat. Res. Soc 116 (1988) 219
-
(1988)
Proc. Mat. Res. Soc
, vol.116
, pp. 219
-
-
Lee, H.P.1
Huang, Y.-H.2
Liu, X.3
Lin, H.4
Smith, J.S.5
Weber, E.R.6
Yu, P.7
Wang, S.8
Lilliental-Weber, Z.9
-
104
-
-
36449009134
-
-
Li J.H., Koppensteiner E., Bauer G., Hohnisch M., Herzog H.J., and Schaffler F. Appl. Phys. Lett. 67 (1995) 223
-
(1995)
Appl. Phys. Lett.
, vol.67
, pp. 223
-
-
Li, J.H.1
Koppensteiner, E.2
Bauer, G.3
Hohnisch, M.4
Herzog, H.J.5
Schaffler, F.6
-
105
-
-
77956709990
-
-
Liliental-Weber Z., Weber E.R., Washburn J., Liu T.Y., and Kroemer H. Proc. Mat. Res. Soc. 91 (1987) 91
-
(1987)
Proc. Mat. Res. Soc.
, vol.91
, pp. 91
-
-
Liliental-Weber, Z.1
Weber, E.R.2
Washburn, J.3
Liu, T.Y.4
Kroemer, H.5
-
109
-
-
0015996482
-
-
(and references contained therein).
-
Matthews J.W. J. Vac. Sci. Technoi 12 (1975) 126 (and references contained therein).
-
(1975)
J. Vac. Sci. Technoi
, vol.12
, pp. 126
-
-
Matthews, J.W.1
-
122
-
-
5544297060
-
-
Noble D.B., Hoyt J.L., Nix W.D., Gibbons J.F., Laderman S.S., Turner J.E., and Scott M.P. Appl. Phys. Lett 58 (1991) 1536
-
(1991)
Appl. Phys. Lett
, vol.58
, pp. 1536
-
-
Noble, D.B.1
Hoyt, J.L.2
Nix, W.D.3
Gibbons, J.F.4
Laderman, S.S.5
Turner, J.E.6
Scott, M.P.7
-
131
-
-
0023451367
-
-
Rozgonyi G.A., Saleh A.S.M., Radzimski Z.J., Kola R.R., Honeycutt J., Bean K.E., and Lindbergh K. J. Cryst. Growth 85 (1987) 300
-
(1987)
J. Cryst. Growth
, vol.85
, pp. 300
-
-
Rozgonyi, G.A.1
Saleh, A.S.M.2
Radzimski, Z.J.3
Kola, R.R.4
Honeycutt, J.5
Bean, K.E.6
Lindbergh, K.7
-
153
-
-
45249129788
-
-
Van de Walle G.F.A., Van Ijzendoorn L.J., Van Gorkum A.A., Van den Heuvel R.A., Theunissed A.M.L., and Gravestein D.J. Thin Solid Films 183 (1990) 183
-
(1990)
Thin Solid Films
, vol.183
, pp. 183
-
-
Van de Walle, G.F.A.1
Van Ijzendoorn, L.J.2
Van Gorkum, A.A.3
Van den Heuvel, R.A.4
Theunissed, A.M.L.5
Gravestein, D.J.6
-
155
-
-
0016603730
-
-
Matthews J.W. (Ed), Academic, New York
-
Van der Merwe J.H., and Ball C.A.B. In: Matthews J.W. (Ed). Epitaxial Growth, Part b (1975), Academic, New York 493-528
-
(1975)
Epitaxial Growth, Part b
, pp. 493-528
-
-
Van der Merwe, J.H.1
Ball, C.A.B.2
-
156
-
-
0008039941
-
Properties of Strained and Relaxed SiGe E
-
Kasper IEEE EMIS, London, England, and references therein
-
Wang, K.L. and Zheng, X. (1995). Properties of Strained and Relaxed SiGe E. Kasper (IEEE EMIS Datareviews Series No. 12, London, England, 1995), p. 70-78, and references therein.
-
(1995)
Datareviews Series
, vol.12
, pp. 70-78
-
-
Wang, K.L.1
Zheng, X.2
-
160
-
-
0001431097
-
-
Yamashita Y., Maeda K., Fujita K., Usami N., Suzuki K., Fukatsu S., Mera Y., and Shiraki Y. Phil. Mag. Lett. 67 (1993) 165
-
(1993)
Phil. Mag. Lett.
, vol.67
, pp. 165
-
-
Yamashita, Y.1
Maeda, K.2
Fujita, K.3
Usami, N.4
Suzuki, K.5
Fukatsu, S.6
Mera, Y.7
Shiraki, Y.8
|