Analytical possibilities of total reflection X-ray spectrometry (TXRF) for trace selenium determination in soils

Analytical Chemistry

Volumn 82, Issue 18, 2010, Pages 7744-7751

  Margui E ^a,b   Floor, G H ^b   Hidalgo, M ^b   Kregsamer, P ^c   Roman Ross G ^b   Streli, C ^c   Queralt, I ^a  

^a INSTITUTE OF EARTH SCIENCES JAUME ALMERA   (Spain)

^b UNIVERSITY OF GIRONA   (Spain)

^c TU WIEN   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL APPROACH; ANALYTICAL METHODOLOGY; ANALYTICAL STRATEGY; CERTIFIED VALUES; COMPLEX MATRICES; DIRECT ANALYSIS; DISPERSIVE LIQUID-LIQUID MICROEXTRACTION; ETHYL ETHER; EXPERIMENTAL PARAMETERS; LIMIT OF DETECTION; LIQUID-LIQUID EXTRACTION PROCEDURE; LOW CONCENTRATIONS; MAJOR ELEMENTS; MATRIX EFFECTS; SAMPLE VOLUME; SELENIUM DETERMINATION; SOIL EXTRACTS; SOIL MATRICES; SOLID SUSPENSIONS; SPECTROMETRIC TECHNIQUES; SPECTROSCOPIC TECHNIQUE; TOTAL REFLECTION; TOTAL REFLECTION X-RAY SPECTROMETRIES; TOXIC EFFECT;

CHROMIUM; CONCENTRATION (PROCESS); ELECTROMAGNETIC WAVE REFLECTION; ETHERS; INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY; LIQUIDS; MASS SPECTROMETERS; SELENIUM; SOLVENT EXTRACTION; SPECTROMETRY; SPECTROSCOPIC ANALYSIS; SUSPENSIONS (FLUIDS); TRACE ANALYSIS;

SOILS;

IRON; SELENIUM;

ARTICLE; CHEMISTRY; FRACTIONATION; ISOLATION AND PURIFICATION; METHODOLOGY; SOIL; SPECTROSCOPY; SUSPENSION;

CHEMICAL FRACTIONATION; IRON; SELENIUM; SOIL; SPECTRUM ANALYSIS; SUSPENSIONS;

EID: 77956583341     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac101615w     Document Type: Article

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