-
1
-
-
0027697678
-
Current gain collapse in microwave multifinger heterojunction bipolar transistors operated at very high power densities
-
W. Liu et al., 'Current gain collapse in microwave multifinger heterojunction bipolar transistors operated at very high power densities,' IEEE Trans. Electron Devices, vol.40, pp. 1917-1927, 1993.
-
(1993)
IEEE Trans. Electron Devices
, vol.40
, pp. 1917-1927
-
-
Liu, W.1
-
2
-
-
0027609967
-
The effects of BJT self-heating on circuit behavior
-
R. M. Fox et al., 'The effects of BJT self-heating on circuit behavior,' IEEE J. Solid State Circuits, vol.28, pp. 678-685, 1993.
-
(1993)
IEEE J. Solid State Circuits
, vol.28
, pp. 678-685
-
-
Fox, R.M.1
-
3
-
-
0032292816
-
Electrothermal SPICE macromodeling of the power bipolar transistor including the avalanche and secondary breakdowns
-
A. Maxim and G. Maxim, 'Electrothermal SPICE macromodeling of the power bipolar transistor including the avalanche and secondary breakdowns,' Proc. IEEE IECON, 1, pp. 348-352, 1998.
-
(1998)
Proc. IEEE IECON
, vol.1
, pp. 348-352
-
-
Maxim, A.1
Maxim, G.2
-
4
-
-
3142689612
-
A novel SPICE macromodel of BJTs including the temperature dependence of high-injection effects
-
V. d'Alessandro et al., 'A novel SPICE macromodel of BJTs including the temperature dependence of high-injection effects,' Proc. IEEE MIEL, 1, pp. 253-256, 2004.
-
(2004)
Proc. IEEE MIEL
, vol.1
, pp. 253-256
-
-
D'Alessandro, V.1
-
5
-
-
0020113887
-
Network analysis approach to multidimensional modeling of transistors including thermal effects
-
M. Latif and P. R. Bryant, 'Network analysis approach to multidimensional modeling of transistors including thermal effects,' IEEE Trans. on Computer-Aided Design of ICs and Systems, vol.1, pp. 94-101, 1982.
-
(1982)
IEEE Trans. on Computer-Aided Design of ICs and Systems
, vol.1
, pp. 94-101
-
-
Latif, M.1
Bryant, P.R.2
-
7
-
-
34247474478
-
Mextram (level 504). the philips model for bipolar transistors
-
J.C.J. Paasschens et al., 'Mextram (level 504). The Philips model for bipolar transistors,' Proc. FSA Modeling Workshop, 2002.
-
(2002)
Proc. FSA Modeling Workshop
-
-
Paasschens, J.C.J.1
-
8
-
-
0034291496
-
Thermal analysis of solid-state devices and circuits: An analytical approach
-
N. Rinaldi, 'Thermal analysis of solid-state devices and circuits: An analytical approach,' Solid-State Electronics, vol.44, pp. 1789-1798, 2000.
-
(2000)
Solid-State Electronics
, vol.44
, pp. 1789-1798
-
-
Rinaldi, N.1
-
9
-
-
0035694093
-
On the modeling of the transient thermal behavior of semiconductor devices
-
N. Rinaldi, 'On the modeling of the transient thermal behavior of semiconductor devices,' IEEE Trans. Electron Devices, vol.48, pp. 2796-2802, 2001.
-
(2001)
IEEE Trans. Electron Devices
, vol.48
, pp. 2796-2802
-
-
Rinaldi, N.1
-
10
-
-
0742301753
-
A back-wafer contacted silicon-on-glass integrated bipolar process - Part I: The conflict electrical versus thermal isolation
-
L.K. Nanver et al., 'A back-wafer contacted silicon-on-glass integrated bipolar process - Part I: The conflict electrical versus thermal isolation,' IEEE Trans. Electron Devices, vol.51, pp. 42-50, 2004.
-
(2004)
IEEE Trans. Electron Devices
, vol.51
, pp. 42-50
-
-
Nanver, L.K.1
-
12
-
-
5444249335
-
Extraction and modeling of self-heating and mutual thermal coupling impedance of bipolar transistors
-
N. Nenadović et al., 'Extraction and modeling of self-heating and mutual thermal coupling impedance of bipolar transistors' IEEE J. Solid-State Circuits, vol.39, pp. 1764-1772, 2004.
-
(2004)
IEEE J. Solid-State Circuits
, vol.39
, pp. 1764-1772
-
-
Nenadović, N.1
-
13
-
-
0742304012
-
A back-wafer contacted silicon-on-glass integrated bipolar process - Part II: A novel analysis of thermal breakdown
-
N. Nenadović et al., 'A back-wafer contacted silicon-on-glass integrated bipolar process - Part II: A novel analysis of thermal breakdown,' IEEE Trans. Electron Devices, vol.51, pp. 51-62, 2004.
-
(2004)
IEEE Trans. Electron Devices
, vol.51
, pp. 51-62
-
-
Nenadović, N.1
-
14
-
-
26244467893
-
Theory of electrothermal behavior of bipolar transistors: Part i - Single-finger devices
-
N. Rinaldi and V. d'Alessandro, 'Theory of electrothermal behavior of bipolar transistors: Part I - Single-finger devices,' IEEE Trans. Electron Devices, vol.52, pp. 2009- 2021, 2005.
-
(2005)
IEEE Trans. Electron Devices
, vol.52
, pp. 2009-2021
-
-
Rinaldi, N.1
D'Alessandro, V.2
-
15
-
-
33645742863
-
Restabilizing mechanisms after the onset of thermal instability in bipolar transistors
-
accepted for publication
-
N. Nenadović et al., 'Restabilizing mechanisms after the onset of thermal instability in bipolar transistors,' IEEE Trans. Electron Devices, 2006 (accepted for publication).
-
(2006)
IEEE Trans. Electron Devices
-
-
Nenadović, N.1
|