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Volumn , Issue , 2006, Pages 451-454

Fully automated electrothermal simulation using standard CAD tools

Author keywords

[No Author keywords available]

Indexed keywords

ADVANCED ANALYTICS; MICROELECTRONICS; SOFTWARE RELIABILITY; SOLID STATE DEVICES;

EID: 77956548993     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICMEL.2006.1650998     Document Type: Conference Paper
Times cited : (5)

References (15)
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  • 5
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    • Rinaldi, N.1
  • 9
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    • On the modeling of the transient thermal behavior of semiconductor devices
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  • 10
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  • 12
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    • Extraction and modeling of self-heating and mutual thermal coupling impedance of bipolar transistors
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    • accepted for publication
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.