A novel SPICE macromodel of BJTs including the temperature dependence of high-injection effects

Proceedings of the International Conference on Microelectronics

Volumn 24 I, Issue , 2004, Pages 253-256

  D'Alessandro, V ^a   Nenadovic N ^b   Tamigi, F ^a   Rinaldi, N ^a   Nanver, L K ^b   Slotboom, J W ^b  

^a UNIVERSITY OF NAPLES FEDERICO II   (Italy)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; ELECTRIC POTENTIAL; GATES (TRANSISTOR); MATHEMATICAL MODELS; SEMICONDUCTOR JUNCTIONS; THERMAL CONDUCTIVITY; TRANSISTORS;

ELECTROTHERMAL STABILIZING; HIGH-INJECTION EFFECTS; THERMAL MODELS;

ELECTROMAGNETIC FIELDS;

EID: 3142689612     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

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